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Paper Abstract and Keywords
Presentation 2014-01-28 15:00
[Poster Presentation] An Optimum Asymmetric Coding in Each Number of PE Cycle for 1Xnm NAND Flash Memories
Senju Yamazaki (Chuo Univ), Shuhei Tanakamaru (Univ of Tokyo), Ken Takeuchi (Chuo Univ) ICD2013-106
Abstract (in Japanese) (See Japanese page) 
(in English) The asymmetric coding increases the population of ‘1’s or ‘0’s in programming data to reduce bit errors, and thus reliability of NAND flash memories improves. Furthermore this method can change the rate of ‘1’s or ‘0’s in programming data by changing the code length. This paper verifies the effect of asymmetric coding of 1Xnm NAND flash memories in each number of PE cycle and each code length. Furthermore the optimum asymmetric coding is investigated.
Keyword (in Japanese) (See Japanese page) 
(in English) NAND flash memory / asymmetric coding / reliability / / / / /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 419, ICD2013-106, pp. 19-19, Jan. 2014.
Paper # ICD2013-106 
Date of Issue 2014-01-21 (ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ICD2013-106

Conference Information
Committee ICD  
Conference Date 2014-01-28 - 2014-01-29 
Place (in Japanese) (See Japanese page) 
Place (in English) Kyoto Univ. Tokeidai Kinenkan 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ICD 
Conference Code 2014-01-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) An Optimum Asymmetric Coding in Each Number of PE Cycle for 1Xnm NAND Flash Memories 
Sub Title (in English)  
Keyword(1) NAND flash memory  
Keyword(2) asymmetric coding  
Keyword(3) reliability  
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1st Author's Name Senju Yamazaki  
1st Author's Affiliation Chuo University (Chuo Univ)
2nd Author's Name Shuhei Tanakamaru  
2nd Author's Affiliation University of Tokyo (Univ of Tokyo)
3rd Author's Name Ken Takeuchi  
3rd Author's Affiliation Chuo University (Chuo Univ)
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Speaker Author-1 
Date Time 2014-01-28 15:00:00 
Presentation Time 120 minutes 
Registration for ICD 
Paper # ICD2013-106 
Volume (vol) vol.113 
Number (no) no.419 
Page p.19 
#Pages 1 
Date of Issue 2014-01-21 (ICD) 

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