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| Presentation | 2014-01-29 11:00 [Invited Talk] Reliability on Integrated Circuits -- Details of Soft Errors -- Kazutoshi Kobayashi (Kyoto Inst. of Tech.)  ICD2013-134 Link to ES Tech. Rep. Archives: ICD2013-134 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | 本講演では，LSIの微細化とともに悪化している信頼性のうち，特にソフトエラー と呼ばれる一時故障に焦点を当ててその概要を紹介する．ソフトエラーは主に パッケージからのα線，宇宙からの中性子線によるメモリやFFの一時的な反転 である．α線はエネルギーは弱いものの，LSI表面より入射すると直接，電子正 孔対を発生させる．一方，中性子は，LSI表面より入射して，シリコン原子と核 反応を起こすことにより，電子正孔対を発生させる．α線の加速試験には， Am241などの線源を用いることができ，研究室で手軽にソフトエラー測定を行う ことが出来る．一方，地上でのエネルギースペクトラムのまま加速する白色中 性子線は，加速器でプロトンを加速しタングステンのターゲットに当てて発生 させるため，加速器までDUTや測定器を運んで実験をしなければならない． 自動車，サーバー，医療機器などの信頼性の必要なLSIではすでに冗長化などの 対策が行われている．ここでは，ソフトエラーとは何かというチュートリアル からはじめ，その対策法，我々の研究グループで行なっている研究内容とその 結果について講演を行う． |
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| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Reliability / soft Error / / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 113, no. 419, ICD2013-134, pp. 81-81, Jan. 2014. | |
| Paper # | ICD2013-134 | |
| Date of Issue | 2014-01-21 (ICD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | ICD2013-134 Link to ES Tech. Rep. Archives: ICD2013-134 |
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| Conference Information | |
| Committee | ICD |
| Conference Date | 2014-01-28 - 2014-01-29 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kyoto Univ. Tokeidai Kinenkan |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | ICD |
| Conference Code | 2014-01-ICD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Reliability on Integrated Circuits |
| Sub Title (in English) | Details of Soft Errors |
| Keyword(1) | Reliability |
| Keyword(2) | soft Error |
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| 1st Author's Name | Kazutoshi Kobayashi |
| 1st Author's Affiliation | Kyoto Institute of Technology (Kyoto Inst. of Tech.) |
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| Speaker | Author-1 |
| Date Time | 2014-01-29 11:00:00 |
| Presentation Time | 60 minutes |
| Registration for | ICD |
| Paper # | ICD2013-134 |
| Volume (vol) | vol.113 |
| Number (no) | no.419 |
| Page | p.81 |
| #Pages | 1 |
| Date of Issue | 2014-01-21 (ICD) |
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