IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2014-03-05 14:15
Post –Silicon Tuning of Body Biasing and Clock Skew for Low-Voltage LSI
Tatsunori Kubo, Mineo Kaneko (JASIT) VLD2013-163
Abstract (in Japanese) (See Japanese page) 
(in English) As the device feature size decreases, operation speed increases and supply voltage decreases, variation of the signal propagation delay and the increase of the leakage current become serious problem. Post-silicon tuning techniques including skew tuning and body bias tuning are promissing solutions for these problems. In this paper , the combination of skew tuning and body bias tuning has been studied, and its potential for saving power consumption while keeping an operation speed of the circuit has been shown through simulations.
Keyword (in Japanese) (See Japanese page) 
(in English) clock slew / delay variation / threshold voltage / low power / low voltage / / /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 454, VLD2013-163, pp. 159-163, March 2014.
Paper # VLD2013-163 
Date of Issue 2014-02-24 (VLD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2013-163

Conference Information
Committee VLD  
Conference Date 2014-03-03 - 2014-03-05 
Place (in Japanese) (See Japanese page) 
Place (in English) Okinawa Seinen Kaikan 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Technology for System-on-Silicon 
Paper Information
Registration To VLD 
Conference Code 2014-03-VLD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Post –Silicon Tuning of Body Biasing and Clock Skew for Low-Voltage LSI 
Sub Title (in English)  
Keyword(1) clock slew  
Keyword(2) delay variation  
Keyword(3) threshold voltage  
Keyword(4) low power  
Keyword(5) low voltage  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Tatsunori Kubo  
1st Author's Affiliation Japan Advanced Institute of Science and Technology (JASIT)
2nd Author's Name Mineo Kaneko  
2nd Author's Affiliation Japan Advanced Institute of Science and Technology (JASIT)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2014-03-05 14:15:00 
Presentation Time 25 minutes 
Registration for VLD 
Paper # VLD2013-163 
Volume (vol) vol.113 
Number (no) no.454 
Page pp.159-163 
#Pages
Date of Issue 2014-02-24 (VLD) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan