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Paper Abstract and Keywords
Presentation 2014-06-20 11:00
Identification Method of Fault-injected Timing on Cryptographic Devices Using Side-channel Information
Ko Nakamaura, Yu-ichi Hayashi, Takaaki Mizuki, Naofumi Homma, Takafumi Aoki, Hideaki Sone (Tohoku Univ.) EMCJ2014-11
Abstract (in Japanese) (See Japanese page) 
(in English) This paper describes a new technique to choose faulty ciphertexts available for Differential Fault Analysis (DFA) from those obtained by randomly executing the intentional electromagnetic interference (IEMI) fault-injection method. This technique employs side-channel information as an identifier in order to choose faulty ciphertexts to be suitable for DFA. For a fundamental study, we monitor transient voltage as side-channel information on a cryptographic device in our experiment. As a result, the amplitude of the waveform increased at the timing of fault-injection. This implies that we can choose suitable faulty ciphertexts using such a change of side-channel information in time domain.
Keyword (in Japanese) (See Japanese page) 
(in English) Side-channel Information / Intentional Electromagnetic Interference / Failure Timing / Fault Analysis / / / /  
Reference Info. IEICE Tech. Rep., vol. 114, no. 93, EMCJ2014-11, pp. 7-12, June 2014.
Paper # EMCJ2014-11 
Date of Issue 2014-06-13 (EMCJ) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMCJ2014-11

Conference Information
Committee EMCJ IEE-EMC  
Conference Date 2014-06-20 - 2014-06-20 
Place (in Japanese) (See Japanese page) 
Place (in English) Kobe Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) PCB, Information Security, EMC 
Paper Information
Registration To EMCJ 
Conference Code 2014-06-EMCJ-EMC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Identification Method of Fault-injected Timing on Cryptographic Devices Using Side-channel Information 
Sub Title (in English)  
Keyword(1) Side-channel Information  
Keyword(2) Intentional Electromagnetic Interference  
Keyword(3) Failure Timing  
Keyword(4) Fault Analysis  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Ko Nakamaura  
1st Author's Affiliation Tohoku University (Tohoku Univ.)
2nd Author's Name Yu-ichi Hayashi  
2nd Author's Affiliation Tohoku University (Tohoku Univ.)
3rd Author's Name Takaaki Mizuki  
3rd Author's Affiliation Tohoku University (Tohoku Univ.)
4th Author's Name Naofumi Homma  
4th Author's Affiliation Tohoku University (Tohoku Univ.)
5th Author's Name Takafumi Aoki  
5th Author's Affiliation Tohoku University (Tohoku Univ.)
6th Author's Name Hideaki Sone  
6th Author's Affiliation Tohoku University (Tohoku Univ.)
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Speaker Author-1 
Date Time 2014-06-20 11:00:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2014-11 
Volume (vol) vol.114 
Number (no) no.93 
Page pp.7-12 
#Pages 6 
Date of Issue 2014-06-13 (EMCJ) 

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