Paper Abstract and Keywords |
Presentation |
2014-06-20 14:05
A X-Filling Method for Low-Capture-Power Scan Test Generation Fuqiang Li, Xiaoqing Wen, Kohei Miyase, Stefan Holst, Seiji Kajihara (Kyushu Inst. of Tech.) DC2014-12 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
In order to generate a low capture power test pattern, we propose an
X-filling method to suppress local switching activity (LSA), which is a
local signal value transition metric that has a strong correlation with
IR-Drop. In this method, after having divided the layout of a circuit into
unit areas and then determined the priorities of X bits in a test cube based
on the LSA of each unit area, we assign to X bits appropriate logic values
which are easy to propagate. Experimental results show that the proposed
method can effectively reduce the LSA in unit areas. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Low Capture Power / IR-Drop / Local Switching Activity / At-Speed Scan Test / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 114, no. 99, DC2014-12, pp. 15-20, June 2014. |
Paper # |
DC2014-12 |
Date of Issue |
2014-06-13 (DC) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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DC2014-12 |
Conference Information |
Committee |
DC |
Conference Date |
2014-06-20 - 2014-06-20 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Design/Test/Verification |
Paper Information |
Registration To |
DC |
Conference Code |
2014-06-DC |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
A X-Filling Method for Low-Capture-Power Scan Test Generation |
Sub Title (in English) |
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Keyword(1) |
Low Capture Power |
Keyword(2) |
IR-Drop |
Keyword(3) |
Local Switching Activity |
Keyword(4) |
At-Speed Scan Test |
Keyword(5) |
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1st Author's Name |
Fuqiang Li |
1st Author's Affiliation |
Kyushu Institute of Technology (Kyushu Inst. of Tech.) |
2nd Author's Name |
Xiaoqing Wen |
2nd Author's Affiliation |
Kyushu Institute of Technology (Kyushu Inst. of Tech.) |
3rd Author's Name |
Kohei Miyase |
3rd Author's Affiliation |
Kyushu Institute of Technology (Kyushu Inst. of Tech.) |
4th Author's Name |
Stefan Holst |
4th Author's Affiliation |
Kyushu Institute of Technology (Kyushu Inst. of Tech.) |
5th Author's Name |
Seiji Kajihara |
5th Author's Affiliation |
Kyushu Institute of Technology (Kyushu Inst. of Tech.) |
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Speaker |
Author-1 |
Date Time |
2014-06-20 14:05:00 |
Presentation Time |
25 minutes |
Registration for |
DC |
Paper # |
DC2014-12 |
Volume (vol) |
vol.114 |
Number (no) |
no.99 |
Page |
pp.15-20 |
#Pages |
6 |
Date of Issue |
2014-06-13 (DC) |
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