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Paper Abstract and Keywords
Presentation 2014-07-10 15:20
Comparison of Electromagnetic Injection Configurations in terms of Induced Disturbance Observed near Integrated Circuit on Board
Kazuhiro Maeshima, Kengo Iokibe (Okayama Univ.), Tetsushi Watanabe (Industrial Technology Center of Okayama Prefecture), Yoshitaka Toyota (Okayama Univ.) EMCJ2014-22
Abstract (in Japanese) (See Japanese page) 
(in English) In this paper, influence on the noise observed on a board by changing pulse injection configurations. The experiment system consists of Electrical Fast Transient / Burst (EFT / B) generator, coupler and Printed Circuit Board (PCB). A Coupling Decoupling Network (CDN) and a current probe were applied to coupler in order to attempt capacitive coupling and magnetic coupling. Positive pulse injection and Negative Pulse injection ware also tried. Furthermore, two kinds of states were attempt: the PCB’s ground was connected or non-connected to system ground. The PCB has a Field-Programmable Gate Array (FPGA) implemented an encryption circuit. A burst pulse was injected to PCB while the encryption circuit is running. Power supply voltage of the PCB, the IC core voltage and clock signal was observed by an oscilloscope at that moment.
Keyword (in Japanese) (See Japanese page) 
(in English) Electromagnetic Compatibility(EMC) / immunity / / / / / /  
Reference Info. IEICE Tech. Rep., vol. 114, no. 129, EMCJ2014-22, pp. 31-36, July 2014.
Paper # EMCJ2014-22 
Date of Issue 2014-07-03 (EMCJ) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMCJ  
Conference Date 2014-07-10 - 2014-07-10 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Young Scientist Meeting 
Paper Information
Registration To EMCJ 
Conference Code 2014-07-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Comparison of Electromagnetic Injection Configurations in terms of Induced Disturbance Observed near Integrated Circuit on Board 
Sub Title (in English)  
Keyword(1) Electromagnetic Compatibility(EMC)  
Keyword(2) immunity  
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1st Author's Name Kazuhiro Maeshima  
1st Author's Affiliation Okayama University (Okayama Univ.)
2nd Author's Name Kengo Iokibe  
2nd Author's Affiliation Okayama University (Okayama Univ.)
3rd Author's Name Tetsushi Watanabe  
3rd Author's Affiliation Industrial Technology Center of Okayama Prefecture (Industrial Technology Center of Okayama Prefecture)
4th Author's Name Yoshitaka Toyota  
4th Author's Affiliation Okayama University (Okayama Univ.)
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Speaker Author-1 
Date Time 2014-07-10 15:20:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2014-22 
Volume (vol) vol.114 
Number (no) no.129 
Page pp.31-36 
#Pages 6 
Date of Issue 2014-07-03 (EMCJ) 

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