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| Presentation | 2014-07-10 15:45 Feasibility of Fault-injected Timing Identification for Actual Cryptographic Devices Using Side-channel Information Ko Nakamaura, Yu-ichi Hayashi, Takaaki Mizuki, Naofumi Homma, Takafumi Aoki, Hideaki Sone (Tohoku Univ.)  EMCJ2014-23 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | The intentional electromagnetic interference (IEMI) fault-injection method using continuous sine waves causes random-bytes faults in the cryptographic devices. Therefore, it was difficult to obtain faulty ciphertext available for conventional analysis methods which assumes the specific byte errors in ciphertext. In this paper, in order to identify the number of fault-injected bytes, we describe an identification technique using side-channel information. The feasibility of the proposal method is verified by observation of voltage waveforms between a power line and ground plane of cryptographic module in time domain with time resolution by 1 ns. In our experiment, we employ a real cryptographic device with Advanced Encryption Standard (AES) implemented and a clock glitch generator which can be adjusted by 0.17 ns steps. Through this experiment, we identified that the change of side-channel waveforms correspond to the number of faulty bytes. Moreover, on the basis of this result, we showed that it is possible to extract available faulty ciphertext for the conventional analysis methods. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Side-channel Information / Intentional Electromagnetic Interference / Fault Analysis / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 114, no. 129, EMCJ2014-23, pp. 37-42, July 2014. | |
| Paper # | EMCJ2014-23 | |
| Date of Issue | 2014-07-03 (EMCJ) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | EMCJ2014-23 |
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| Conference Information | |
| Committee | EMCJ |
| Conference Date | 2014-07-10 - 2014-07-10 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Young Scientist Meeting |
| Paper Information | |
| Registration To | EMCJ |
| Conference Code | 2014-07-EMCJ |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Feasibility of Fault-injected Timing Identification for Actual Cryptographic Devices Using Side-channel Information |
| Sub Title (in English) | |
| Keyword(1) | Side-channel Information |
| Keyword(2) | Intentional Electromagnetic Interference |
| Keyword(3) | Fault Analysis |
| Keyword(4) | |
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| 1st Author's Name | Ko Nakamaura |
| 1st Author's Affiliation | Tohoku University (Tohoku Univ.) |
| 2nd Author's Name | Yu-ichi Hayashi |
| 2nd Author's Affiliation | Tohoku University (Tohoku Univ.) |
| 3rd Author's Name | Takaaki Mizuki |
| 3rd Author's Affiliation | Tohoku University (Tohoku Univ.) |
| 4th Author's Name | Naofumi Homma |
| 4th Author's Affiliation | Tohoku University (Tohoku Univ.) |
| 5th Author's Name | Takafumi Aoki |
| 5th Author's Affiliation | Tohoku University (Tohoku Univ.) |
| 6th Author's Name | Hideaki Sone |
| 6th Author's Affiliation | Tohoku University (Tohoku Univ.) |
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| Speaker | Author-1 |
| Date Time | 2014-07-10 15:45:00 |
| Presentation Time | 25 minutes |
| Registration for | EMCJ |
| Paper # | EMCJ2014-23 |
| Volume (vol) | vol.114 |
| Number (no) | no.129 |
| Page | pp.37-42 |
| #Pages | 6 |
| Date of Issue | 2014-07-03 (EMCJ) |
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