Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2014-09-05 13:45
Problem with Interpretation of Trace Distance as Failure Probability in Quantum Key Distribution: Part II
Takehisa Iwakoshi (Tamagawa Univ.) ISEC2014-48
Abstract (in Japanese) (See Japanese page) 
(in English) Quantum Key Distribution (QKD) has been attracting attention as an important technique to share a provably secure key under the existence of an eavesdropper. However, a security claim has been made repeatedly since 2009 that trace distance, a security parameter in QKD, is not interpreted correctly. The previous study pointed out that the interpretation was based on the misuse of coupling lemma. In this time, it is explained that trace distance appears only in Helstrom’s quantum binary detection theory.
Keyword (in Japanese) (See Japanese page) 
(in English) Quantum Key Distribution / Security proof / Trace Distance / Quantum Detection Theory / Failure probability / / /  
Reference Info. IEICE Tech. Rep., vol. 114, no. 203, ISEC2014-48, pp. 9-11, Sept. 2014.
Paper # ISEC2014-48 
Date of Issue 2014-08-29 (ISEC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ISEC2014-48

Conference Information
Committee ISEC  
Conference Date 2014-09-05 - 2014-09-05 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ISEC 
Conference Code 2014-09-ISEC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Problem with Interpretation of Trace Distance as Failure Probability in Quantum Key Distribution: Part II 
Sub Title (in English)  
Keyword(1) Quantum Key Distribution  
Keyword(2) Security proof  
Keyword(3) Trace Distance  
Keyword(4) Quantum Detection Theory  
Keyword(5) Failure probability  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Takehisa Iwakoshi  
1st Author's Affiliation Tamagawa University (Tamagawa Univ.)
2nd Author's Name  
2nd Author's Affiliation ()
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2014-09-05 13:45:00 
Presentation Time 25 minutes 
Registration for ISEC 
Paper # ISEC2014-48 
Volume (vol) vol.114 
Number (no) no.203 
Page pp.9-11 
#Pages 3 
Date of Issue 2014-08-29 (ISEC) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan