Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2014-11-29 13:00
[Invited Talk] Welding in separation of electrical contacts
Yang Xiaocheng, Liu Jinyou, Wang Qian, Li Zhenbiao, Cai Bingbing, Wang Danjiang (HUST) EMD2014-69
Abstract (in Japanese) (See Japanese page) 
(in English) Electrical endurance tests are conducted with AgSnO2 and AgNi contacts on simulation test device. Waveforms of contact force, displacement, contact voltage and current are recorded with LabVIEW during tests. Meanwhile, aimed to study the changes of contacts gap and the height of pips with the increase of operations numbers, imaging tests focused on surface morphology of electrical contacts are taken by CCD cameras. The test results clarify the existence of welding in separation. The waveforms of different parameters and images obtained during the tests can be used to explore the occurrence pattern of the welding in separation and furthermore to get a deep understanding of its mechanism.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contacts / welding in separation / electrical endurance tests / imaging tests / / / /  
Reference Info. IEICE Tech. Rep., vol. 114, no. 342, EMD2014-69, pp. 25-30, Nov. 2014.
Paper # EMD2014-69 
Date of Issue 2014-11-22 (EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2014-69

Conference Information
Committee EMD  
Conference Date 2014-11-29 - 2014-11-30 
Place (in Japanese) (See Japanese page) 
Place (in English) Chitose Cultural Center 
Topics (in Japanese) (See Japanese page) 
Topics (in English) International Session IS-EMD2014 
Paper Information
Registration To EMD 
Conference Code 2014-11-EMD 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Welding in separation of electrical contacts 
Sub Title (in English)  
Keyword(1) electrical contacts  
Keyword(2) welding in separation  
Keyword(3) electrical endurance tests  
Keyword(4) imaging tests  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Yang Xiaocheng  
1st Author's Affiliation Huazhong University of Science and Technology (HUST)
2nd Author's Name Liu Jinyou  
2nd Author's Affiliation Huazhong University of Science and Technology (HUST)
3rd Author's Name Wang Qian  
3rd Author's Affiliation Huazhong University of Science and Technology (HUST)
4th Author's Name Li Zhenbiao  
4th Author's Affiliation Huazhong University of Science and Technology (HUST)
5th Author's Name Cai Bingbing  
5th Author's Affiliation Huazhong University of Science and Technology (HUST)
6th Author's Name Wang Danjiang  
6th Author's Affiliation Huazhong University of Science and Technology (HUST)
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-4 
Date Time 2014-11-29 13:00:00 
Presentation Time 30 minutes 
Registration for EMD 
Paper # EMD2014-69 
Volume (vol) vol.114 
Number (no) no.342 
Page pp.25-30 
#Pages 6 
Date of Issue 2014-11-22 (EMD) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan