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| Presentation | 2014-12-02 16:05 An accelerating method of NBTI degradation transition analysis based on logic simulation Kazunori Mori, Toru Nakura, Tetsuya Iizuka, Kunihiro Asada (UTokyo)  ICD2014-109 CPSY2014-121 Link to ES Tech. Rep. Archives: ICD2014-109 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Negative Bias Temperature Instability (NBTI) degradation is one of the important problems in nano-scale transistors.In this paper, we propose an accurate transient simulation method of NBTI degradation based on Reaction-Diffusion model by calculating hydrogen distribution at gate oxide in each transistor according to the gate input level obtained by logic simulations. We also propose an acceleration scheme of NBTI simulation based on the frequency dependence of NBTI degradation and recovery, that can extend a simulation results of one-second duration into one-year results. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Negative Bias Temperature Instability / Reaction-Diffusion model / reliability / modeling / accelerated aging simulation / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 114, no. 345, ICD2014-109, pp. 141-145, Dec. 2014. | |
| Paper # | ICD2014-109 | |
| Date of Issue | 2014-11-24 (ICD, CPSY) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | ICD2014-109 CPSY2014-121 Link to ES Tech. Rep. Archives: ICD2014-109 |
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| Conference Information | |
| Committee | ICD CPSY |
| Conference Date | 2014-12-01 - 2014-12-02 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | ICD |
| Conference Code | 2014-12-ICD-CPSY |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | An accelerating method of NBTI degradation transition analysis based on logic simulation |
| Sub Title (in English) | |
| Keyword(1) | Negative Bias Temperature Instability |
| Keyword(2) | Reaction-Diffusion model |
| Keyword(3) | reliability |
| Keyword(4) | modeling |
| Keyword(5) | accelerated aging simulation |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Kazunori Mori |
| 1st Author's Affiliation | The University of Tokyo (UTokyo) |
| 2nd Author's Name | Toru Nakura |
| 2nd Author's Affiliation | The University of Tokyo (UTokyo) |
| 3rd Author's Name | Tetsuya Iizuka |
| 3rd Author's Affiliation | The University of Tokyo (UTokyo) |
| 4th Author's Name | Kunihiro Asada |
| 4th Author's Affiliation | The University of Tokyo (UTokyo) |
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| Speaker | Author-1 |
| Date Time | 2014-12-02 16:05:00 |
| Presentation Time | 25 minutes |
| Registration for | ICD |
| Paper # | ICD2014-109, CPSY2014-121 |
| Volume (vol) | vol.114 |
| Number (no) | no.345(ICD), no.346(CPSY) |
| Page | pp.141-145 |
| #Pages | 5 |
| Date of Issue | 2014-11-24 (ICD, CPSY) |
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