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Paper Abstract and Keywords
Presentation 2014-12-19 14:30
Degradation phenomenon of electrical contacts by using a micro-sliding mechanism -- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions (4) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMD2014-96
Abstract (in Japanese) (See Japanese page) 
(in English) Authors have studied degradation phenomenon on contact resistance under the influences of an external micro-oscillation. They have developed a hammering oscillating mechanism (HOM) or a micro-sliding mechanism 1 (MSM1) which provides micro-oscillations for electrical contacts. It is shown that each mechanism is able to simulate an actual degradation phenomenon on electrical contacts. And they have also developed another mechanism, namely a micro-sliding mechanism 2 (MSM2) which provides micro-sliding driven by a piezo-electric actuator and elastic hinges, which has more precise sliding performance, less thermal drift on sliding amplitude, and smaller sized system constituted of commercial parts.

In this paper, they obtain the experimental results of minimal sliding amplitudes to make resistances fluctuate on electrical contacts under some conditions which are three types of input waveforms which are sinusoidal, rectangular, and impulsive, three levels of frictional force which are usual (1.6N/pin), middle (1.0N/pin), and smaller (0.3N/pin) between a male-pin and a female-part using the MSM2.

In addition, they compare the differences on the minimal sliding amplitudes among the above conditions by means of dispersion analysis on statistical test on the degradation phenomenon of electrical contacts. Consequently they obtain that the larger the frictional force is the larger the minimal sliding amplitude is, and they also obtain that the amplitudes are larger in sinusoidal input than in rectangular one and are larger in rectangular input than in impulsive one.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / micro-oscillation / micro-sliding / elastic hinge / input waveform / frictional force / minimal sliding amplitude / statistical analysis  
Reference Info. IEICE Tech. Rep., vol. 114, no. 382, EMD2014-96, pp. 7-12, Dec. 2014.
Paper # EMD2014-96 
Date of Issue 2014-12-12 (EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMD  
Conference Date 2014-12-19 - 2014-12-19 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2014-12-EMD 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation phenomenon of electrical contacts by using a micro-sliding mechanism 
Sub Title (in English) The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions (4) 
Keyword(1) electrical contact  
Keyword(2) micro-oscillation  
Keyword(3) micro-sliding  
Keyword(4) elastic hinge  
Keyword(5) input waveform  
Keyword(6) frictional force  
Keyword(7) minimal sliding amplitude  
Keyword(8) statistical analysis  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co. Ltd. (TMC)
2nd Author's Name Keiji Koshida  
2nd Author's Affiliation TMC System Co. Ltd. (TMC)
3rd Author's Name Hiroaki Kubota  
3rd Author's Affiliation TMC System Co. Ltd. (TMC)
4th Author's Name Koichiro Sawa  
4th Author's Affiliation Nippon Institute of Technology (Nippon Inst. of Tech.)
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Speaker Author-2 
Date Time 2014-12-19 14:30:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # EMD2014-96 
Volume (vol) vol.114 
Number (no) no.382 
Page pp.7-12 
#Pages 6 
Date of Issue 2014-12-12 (EMD) 

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