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Paper Abstract and Keywords
Presentation 2015-01-16 09:35
A 10 MHz to 12 GHz Low-Distortion High-Speed SP4T Switch for RF ATE Using TaON Passivation GaN HEMTs
Masayuki Kimishima, Satosi Koyama, Masao Onishi (Advantest Lab,) ED2014-125 MW2014-189 Link to ES Tech. Rep. Archives: ED2014-125 MW2014-189
Abstract (in Japanese) (See Japanese page) 
(in English) A 10 MHz – 12 GHz low distortion high speed single pole 4 throw (SP4T) GaN HEMT switch for RF Automated Test Equipment (ATE) is described. The switch is fabricated with the Schottky GaN HEMT process with drastically decreased gate leakage current having tantalum oxynitride (TaON) passivation films to improve distortion performances at low frequency. The switch has high input 3rd order intercept point (IP3) of more than 52 dBm across a frequency range of 10 MHz to 12 GHz and fast settling time of less than 10 μs to within 0.01 dB. In addition, a drastic low damage passivation deposition technology can execute very high speed switching performance. An on-chip decode logic with TTL level input for the state control is also integrated.
Keyword (in Japanese) (See Japanese page) 
(in English) GaN HEMT / gate leakage current / RF switch / / / / /  
Reference Info. IEICE Tech. Rep., vol. 114, no. 392, MW2014-189, pp. 47-51, Jan. 2015.
Paper # MW2014-189 
Date of Issue 2015-01-08 (ED, MW) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ED2014-125 MW2014-189 Link to ES Tech. Rep. Archives: ED2014-125 MW2014-189

Conference Information
Committee MW ED  
Conference Date 2015-01-15 - 2015-01-16 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Compound Semiconductor IC and High-Speed, High-Frequency Devices/Microwave Technologies 
Paper Information
Registration To MW 
Conference Code 2015-01-MW-ED 
Language English (Japanese title is available) 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A 10 MHz to 12 GHz Low-Distortion High-Speed SP4T Switch for RF ATE Using TaON Passivation GaN HEMTs 
Sub Title (in English)  
Keyword(1) GaN HEMT  
Keyword(2) gate leakage current  
Keyword(3) RF switch  
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1st Author's Name Masayuki Kimishima  
1st Author's Affiliation Advantest Laboratories (Advantest Lab,)
2nd Author's Name Satosi Koyama  
2nd Author's Affiliation Advantest Laboratories (Advantest Lab,)
3rd Author's Name Masao Onishi  
3rd Author's Affiliation Advantest Laboratories (Advantest Lab,)
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Speaker Author-1 
Date Time 2015-01-16 09:35:00 
Presentation Time 25 minutes 
Registration for MW 
Paper # ED2014-125, MW2014-189 
Volume (vol) vol.114 
Number (no) no.391(ED), no.392(MW) 
Page pp.47-51 
#Pages
Date of Issue 2015-01-08 (ED, MW) 


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