Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2015-01-22 13:00
Ultra-Low Field MRI System using HTS-SQUID with a LC Resonator for Food Inspection
Hirotomo Toyota, Masaaki Yamamoto, Satoshi Kawagoe, Junichi Hatta, Seiichiro Ariyoshi, Saburo Tanaka (Toyohashi Univ. of Technol.) SCE2014-54
Abstract (in Japanese) (See Japanese page) 
(in English) We are developing an Ultra-Low Field (ULF) Magnetic Resonance Imaging (MRI) system using High Temperature Superconductor (HTS)-rf-Superconducting Quantum Interference Device (SQUID) for food inspection because the inspection system can be constructed at a lower cost than a high field (HF) MRI. It was previously found that this system can detect a cucumber sample with a hole in the center. However, as for food inspection, the resolution and the area of the image was not enough. The reasons for these problems were estimated that the sensitivity and the effective area of HTS-SQUID to detect MRI signal from the sample are insufficient. Therefore the LC resonator was placed around the HTS-SQUID, and the effectiveness has been studied to increase the sensitivity and the effective area. In addition, the ambient magnetic noise has become a problem along with improvement of the sensitivity: we developed prototype software for the image reconstruction in order to suppress the influence of noise. As a result, it was found that the improvement of the image quality is possible, and that if reducing an ambient magnetic noise by improving the magnetic shield, the feasibility of the food inspection will be increased.
Keyword (in Japanese) (See Japanese page) 
(in English) ULF / HTS-SQUID / MRI / food inspection / contaminant / / /  
Reference Info. IEICE Tech. Rep., vol. 114, no. 406, SCE2014-54, pp. 31-35, Jan. 2015.
Paper # SCE2014-54 
Date of Issue 2015-01-15 (SCE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SCE2014-54

Conference Information
Committee SCE  
Conference Date 2015-01-22 - 2015-01-22 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikaishinkou-kaikan 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Thin film, device technologies and their applications, etc. 
Paper Information
Registration To SCE 
Conference Code 2015-01-SCE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Ultra-Low Field MRI System using HTS-SQUID with a LC Resonator for Food Inspection 
Sub Title (in English) * 
Keyword(1) ULF  
Keyword(2) HTS-SQUID  
Keyword(3) MRI  
Keyword(4) food inspection  
Keyword(5) contaminant  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Hirotomo Toyota  
1st Author's Affiliation Toyohashi University of Technology (Toyohashi Univ. of Technol.)
2nd Author's Name Masaaki Yamamoto  
2nd Author's Affiliation Toyohashi University of Technology (Toyohashi Univ. of Technol.)
3rd Author's Name Satoshi Kawagoe  
3rd Author's Affiliation Toyohashi University of Technology (Toyohashi Univ. of Technol.)
4th Author's Name Junichi Hatta  
4th Author's Affiliation Toyohashi University of Technology (Toyohashi Univ. of Technol.)
5th Author's Name Seiichiro Ariyoshi  
5th Author's Affiliation Toyohashi University of Technology (Toyohashi Univ. of Technol.)
6th Author's Name Saburo Tanaka  
6th Author's Affiliation Toyohashi University of Technology (Toyohashi Univ. of Technol.)
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2015-01-22 13:00:00 
Presentation Time 25 minutes 
Registration for SCE 
Paper # SCE2014-54 
Volume (vol) vol.114 
Number (no) no.406 
Page pp.31-35 
#Pages 5 
Date of Issue 2015-01-15 (SCE) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan