IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2015-02-13 14:55
A Method of Scheduling in High-Level Synthesis for Hierarchical Testability
Jun Nishimaki, Toshinori Hosokawa (Nihon Univ.), Hideo Fujiwara (Osaka Gakuin Univ.) DC2014-84
Abstract (in Japanese) (See Japanese page) 
(in English) We previously proposed a binding method for hierarchical testability to increase the number of hierarchically testable functional units in hierarchical testing using control data flow graphs. This paper proposes a scheduling method for hierarchical testability to increase the efficiency of the binding method for hierarchical testability. Our proposed method is based on two kinds of scheduling strategies using results of test environment generation. Experimental results show that the combination of our proposed scheduling method with the binding method for hierarchical testability can increase the number of hierarchically testable functional units, and can achieve high fault coverage in hierarchical testing.
Keyword (in Japanese) (See Japanese page) 
(in English) high-level synthesis / scheduling / binding / hierarchical testing / test environments / / /  
Reference Info. IEICE Tech. Rep., vol. 114, no. 446, DC2014-84, pp. 37-42, Feb. 2015.
Paper # DC2014-84 
Date of Issue 2015-02-06 (DC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF DC2014-84

Conference Information
Committee DC  
Conference Date 2015-02-13 - 2015-02-13 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg 
Topics (in Japanese) (See Japanese page) 
Topics (in English) VLSI Design and Test, etc 
Paper Information
Registration To DC 
Conference Code 2015-02-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Method of Scheduling in High-Level Synthesis for Hierarchical Testability 
Sub Title (in English)  
Keyword(1) high-level synthesis  
Keyword(2) scheduling  
Keyword(3) binding  
Keyword(4) hierarchical testing  
Keyword(5) test environments  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Jun Nishimaki  
1st Author's Affiliation Nihon University (Nihon Univ.)
2nd Author's Name Toshinori Hosokawa  
2nd Author's Affiliation Nihon University (Nihon Univ.)
3rd Author's Name Hideo Fujiwara  
3rd Author's Affiliation Osaka Gakuin University (Osaka Gakuin Univ.)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2015-02-13 14:55:00 
Presentation Time 25 minutes 
Registration for DC 
Paper # DC2014-84 
Volume (vol) vol.114 
Number (no) no.446 
Page pp.37-42 
#Pages
Date of Issue 2015-02-06 (DC) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan