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Paper Abstract and Keywords
Presentation 2015-05-29 13:30
Degradation analysis of near-infrared phosphorescence organic light-emitting diodes with platinum-complex emissive layer
Hirotake Kajii, Tatsuya Ueda, Yutaka Ohmori (Osaka Univ.) OME2015-18 Link to ES Tech. Rep. Archives: OME2015-18
Abstract (in Japanese) (See Japanese page) 
(in English) In order to improve the device lifetime of the organic light-emitting diodes (OLEDs), it is necessary to figure out the degradation mechanism. The properties of the undoped and Pt tetraphenyltetrabenzoporphyrin (Pt(tpbp)) doped tris(8-hydroxyquinolinato)aluminum (Alq3)-based OLEDs are investigated. An Alq3 based OLED with an estimated lifetime of approximately 200 hours (time to reach 50 % of initial intensity) at 5,000 cd/m2 is obtained. On the other hand, at 200h, the output of a near-infrared device with Pt(tpbp) doped in Alq3 reaches 80 % of initial intensity. That is, the operating stability is improved for the device with Pt(tpbp) doped in Alq3. For devices with undoped Alq3, Alq3 layer acts as both the emissive and electron transport layers. Hole injection into hole transport layer gets worse after degradation. On the other hand, Pt(tpbp) acts as the carrier trap of Alq3 layer. Alq3 layer mainly acts as the electron transport layers. Photoluminescence (PL) intensity of Pt(tpbp) after degradation reaches approximately 80 % of the initial PL intensity. That is, the optical degradation of Pt(tpbp) molecules results in the decrease of EL intensity.
Keyword (in Japanese) (See Japanese page) 
(in English) Organic light-emitting diode / Pt complex / Near-infrared emission / Degradation analysis / Phosphorescence / / /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 68, OME2015-18, pp. 1-4, May 2015.
Paper # OME2015-18 
Date of Issue 2015-05-22 (OME) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF OME2015-18 Link to ES Tech. Rep. Archives: OME2015-18

Conference Information
Committee OME  
Conference Date 2015-05-29 - 2015-05-29 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Organic Electronics Device, Biotechnolpgy, et al. 
Paper Information
Registration To OME 
Conference Code 2015-05-OME 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation analysis of near-infrared phosphorescence organic light-emitting diodes with platinum-complex emissive layer 
Sub Title (in English)  
Keyword(1) Organic light-emitting diode  
Keyword(2) Pt complex  
Keyword(3) Near-infrared emission  
Keyword(4) Degradation analysis  
Keyword(5) Phosphorescence  
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1st Author's Name Hirotake Kajii  
1st Author's Affiliation Osaka University (Osaka Univ.)
2nd Author's Name Tatsuya Ueda  
2nd Author's Affiliation Osaka University (Osaka Univ.)
3rd Author's Name Yutaka Ohmori  
3rd Author's Affiliation Osaka University (Osaka Univ.)
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Speaker Author-1 
Date Time 2015-05-29 13:30:00 
Presentation Time 25 minutes 
Registration for OME 
Paper # OME2015-18 
Volume (vol) vol.115 
Number (no) no.68 
Page pp.1-4 
#Pages
Date of Issue 2015-05-22 (OME) 


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