Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2015-07-09 11:20
Measurement Method for Induced Current under Radiated Immunity Test
Yasunori Oguri, Kenji Sogo, Seiji Nagakusa, Makoto Tanaka (DENSO) EMCJ2015-34
Abstract (in Japanese) (See Japanese page) 
(in English) The EO/OE converter and the optical fiber cable is used to measure induced current on the wire harness under radiated immunity test. It has better measurement accuracy than the measurement method by using the coaxial cable. However, the EO/OE conversion system is more expensive than coaxial cable’s one. In addition, we have to handle it with care. In this study, We confirmed the error factors of the measurement method by using the coaxial cable. Finally, We proposed the improved measurement method by using tthe coaxial cable.
Keyword (in Japanese) (See Japanese page) 
(in English) Radiated Immunty / Radiated RF Immunity Test / EO/OE converter / / / / /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 131, EMCJ2015-34, pp. 19-23, July 2015.
Paper # EMCJ2015-34 
Date of Issue 2015-07-02 (EMCJ) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMCJ2015-34

Conference Information
Committee EMCJ  
Conference Date 2015-07-09 - 2015-07-09 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Young Scientist Meeting 
Paper Information
Registration To EMCJ 
Conference Code 2015-07-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Measurement Method for Induced Current under Radiated Immunity Test 
Sub Title (in English)  
Keyword(1) Radiated Immunty  
Keyword(2) Radiated RF Immunity Test  
Keyword(3) EO/OE converter  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Yasunori Oguri  
1st Author's Affiliation DENSO CORPORATION (DENSO)
2nd Author's Name Kenji Sogo  
2nd Author's Affiliation DENSO CORPORATION (DENSO)
3rd Author's Name Seiji Nagakusa  
3rd Author's Affiliation DENSO CORPORATION (DENSO)
4th Author's Name Makoto Tanaka  
4th Author's Affiliation DENSO CORPORATION (DENSO)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2015-07-09 11:20:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2015-34 
Volume (vol) vol.115 
Number (no) no.131 
Page pp.19-23 
#Pages 5 
Date of Issue 2015-07-02 (EMCJ) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan