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Paper Abstract and Keywords
Presentation 2015-07-09 10:55
Correlation between Immunity Behavior and Internal Terminal Voltage of LDO Regulator Circuits
Hidetoshi Miyahara, Nobuaki Ikehara, Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2015-33
Abstract (in Japanese) (See Japanese page) 
(in English) Predicting undesired behavior of IC caused by conducted electromagnetic disturbances at a design stage of electronic products is becoming important for front-loading of design process. As a model to predict immunity characteristics, the ICIM-CI (Integrated Circuit Immunity Model for Conducted Immunity) was proposed and has been under standardization in IEC SC47A/WG2. The model expresses immunity behavior by monitoring the immunity criterion at an external terminal. However, an internal terminal voltage or current should be directly related to failure to function. Assessing the external terminal is not absolutely suitable to extract immunity characteristics. In this report, towards modeling by evaluating immunity criteria at an internal terminal, we study correlation between immunity and an internal terminal voltage in a LDO (Low Dropout) voltage regulator composed of discrete devices. Limiting coupling paths, results in simulation using SPICE (Simulation Program IC Emphasis) models and in measurement indicate correlation between immunity and the internal reference voltage. This report shows the mechanism of failure can be expressed by DC component since ICs can't respond in the range of high frequency. In the case of unlimiting disturbance coupling paths, it is necessary to consider and study an influence from disturbance reaching feedback system.
Keyword (in Japanese) (See Japanese page) 
(in English) immunity / LDO voltage regulator / internal terminal / ICIM-CI / conducted disturbance / / /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 131, EMCJ2015-33, pp. 13-18, July 2015.
Paper # EMCJ2015-33 
Date of Issue 2015-07-02 (EMCJ) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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Conference Information
Committee EMCJ  
Conference Date 2015-07-09 - 2015-07-09 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Young Scientist Meeting 
Paper Information
Registration To EMCJ 
Conference Code 2015-07-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Correlation between Immunity Behavior and Internal Terminal Voltage of LDO Regulator Circuits 
Sub Title (in English)  
Keyword(1) immunity  
Keyword(2) LDO voltage regulator  
Keyword(3) internal terminal  
Keyword(4) ICIM-CI  
Keyword(5) conducted disturbance  
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1st Author's Name Hidetoshi Miyahara  
1st Author's Affiliation Kyoto University (Kyoto Univ.)
2nd Author's Name Nobuaki Ikehara  
2nd Author's Affiliation Kyoto University (Kyoto Univ.)
3rd Author's Name Tohlu Matsushima  
3rd Author's Affiliation Kyoto University (Kyoto Univ.)
4th Author's Name Takashi Hisakado  
4th Author's Affiliation Kyoto University (Kyoto Univ.)
5th Author's Name Osami Wada  
5th Author's Affiliation Kyoto University (Kyoto Univ.)
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Speaker Author-1 
Date Time 2015-07-09 10:55:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2015-33 
Volume (vol) vol.115 
Number (no) no.131 
Page pp.13-18 
#Pages
Date of Issue 2015-07-02 (EMCJ) 


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