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Paper Abstract and Keywords
Presentation 2015-07-10 16:20
[Special Talk] Required for Investigation on Functional Safety (1) -- Outline --
Takeshi Aoki, Kenjiro Hamada (Yaskawa Control), Nobuhisa Oikawa (TE), Kazuya Yokoyama (OSDC) EMCJ2015-52 EMD2015-29
Abstract (in Japanese) (See Japanese page) 
(in English) Recently, safety requirements, functional safety standards and their basic parameter; reliability standards have been paid attention to. Furthermore, their development to safety design and preventive measures against failures has been required. In this paper, a bird’s-eye view on international standards of functional safety and reliability are got at first. Next, electromechanical devices and their applications; safety-related systems are focused from them, and reliability parameters, functional safety levels and evaluation systems on relationship between both of them are described. Finally, a part of the application examples of standards and introduction results are introduced.
Keyword (in Japanese) (See Japanese page) 
(in English) Functional safety / Reliability / Safety Integrity Level (SIL) / Failure rate / Weibull analysis / IEC / ISO /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 135, EMD2015-29, pp. 47-51, July 2015.
Paper # EMD2015-29 
Date of Issue 2015-07-03 (EMCJ, EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMCJ2015-52 EMD2015-29

Conference Information
Committee EMCJ EMD  
Conference Date 2015-07-10 - 2015-07-10 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Discharge, Electronic Packaging, EMC 
Paper Information
Registration To EMD 
Conference Code 2015-07-EMCJ-EMD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Required for Investigation on Functional Safety (1) 
Sub Title (in English) Outline 
Keyword(1) Functional safety  
Keyword(2) Reliability  
Keyword(3) Safety Integrity Level (SIL)  
Keyword(4) Failure rate  
Keyword(5) Weibull analysis  
Keyword(6) IEC  
Keyword(7) ISO  
Keyword(8)  
1st Author's Name Takeshi Aoki  
1st Author's Affiliation * (*)
2nd Author's Name Kenjiro Hamada  
2nd Author's Affiliation Yaskawa Control (Yaskawa Control)
3rd Author's Name Nobuhisa Oikawa  
3rd Author's Affiliation Tyco Electronics Japan (TE)
4th Author's Name Kazuya Yokoyama  
4th Author's Affiliation Oki sensor device corporation (OSDC)
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Speaker Author-1 
Date Time 2015-07-10 16:20:00 
Presentation Time 50 minutes 
Registration for EMD 
Paper # EMCJ2015-52, EMD2015-29 
Volume (vol) vol.115 
Number (no) no.134(EMCJ), no.135(EMD) 
Page pp.47-51 
#Pages 5 
Date of Issue 2015-07-03 (EMCJ, EMD) 

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