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Paper Abstract and Keywords
Presentation 2015-09-17 10:55
New Expression of Loss in LC Circuts
Kyohei Yamada, Naoki Sakai, Takashi Ohira (TUT) MW2015-88
Abstract (in Japanese) (See Japanese page) 
(in English) Two kinds of geometric expressions of losses in a matching circuit are presented using a concept of length or distance. The first one, employing "Manhattan distance," describes a loss in an L-shaped matching circuit and a lucid way to reduce the loss. The second one, based on hyperbolic geometry, is for not only L-shaped circuit but also any combination of shunt/series capacitors/inductors.
Keyword (in Japanese) (See Japanese page) 
(in English) matching circuit / lumped-constant element / energy loss / quality factor / Manhattan distance / Poincare metric / /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 227, MW2015-88, pp. 9-12, Sept. 2015.
Paper # MW2015-88 
Date of Issue 2015-09-10 (MW) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF MW2015-88

Conference Information
Committee MW AP  
Conference Date 2015-09-17 - 2015-09-18 
Place (in Japanese) (See Japanese page) 
Place (in English) Oyama National College of Tech. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Microwave and Millimeter-wave 
Paper Information
Registration To MW 
Conference Code 2015-09-MW-AP 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) New Expression of Loss in LC Circuts 
Sub Title (in English)  
Keyword(1) matching circuit  
Keyword(2) lumped-constant element  
Keyword(3) energy loss  
Keyword(4) quality factor  
Keyword(5) Manhattan distance  
Keyword(6) Poincare metric  
Keyword(7)  
Keyword(8)  
1st Author's Name Kyohei Yamada  
1st Author's Affiliation Toyohashi University of Technology (TUT)
2nd Author's Name Naoki Sakai  
2nd Author's Affiliation Toyohashi University of Technology (TUT)
3rd Author's Name Takashi Ohira  
3rd Author's Affiliation Toyohashi University of Technology (TUT)
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Speaker Author-1 
Date Time 2015-09-17 10:55:00 
Presentation Time 25 minutes 
Registration for MW 
Paper # MW2015-88 
Volume (vol) vol.115 
Number (no) no.227 
Page pp.9-12 
#Pages
Date of Issue 2015-09-10 (MW) 


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