Paper Abstract and Keywords |
Presentation |
2015-10-05 16:30
Classical Probabilistic Model of Electron-Wave Refraction on Graphene Shohei Hamada, Hisato Fujisaka, Takeshi Kamio (Hiroshima City Univ.) CAS2015-32 NLP2015-93 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Electron-waves on graphene sheets refract with negative refraction angle on the boundary of different static potential hight.
This propagation characteristic improves precision of frequency discrimination when the sheet is used in optical and terahertz communications.
We derive a probabilistic differential equation whose solution is a sample trajectory of an electron moving on a graphene sheet with step potential and find that the refraction angle expectation of the sample trajectories is nearly equal to the analytical angle obtained from the wave function of the electron.
The derivation of the equation is useful for making a model of the graphene frequency discriminator for circuit simulators. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
graphene / electron-wave lens / probabilistic system / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 115, no. 240, NLP2015-93, pp. 59-63, Oct. 2015. |
Paper # |
NLP2015-93 |
Date of Issue |
2015-09-28 (CAS, NLP) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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CAS2015-32 NLP2015-93 |
Conference Information |
Committee |
NLP CAS |
Conference Date |
2015-10-05 - 2015-10-06 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Aster Plaza |
Topics (in Japanese) |
(See Japanese page) |
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Paper Information |
Registration To |
NLP |
Conference Code |
2015-10-NLP-CAS |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Classical Probabilistic Model of Electron-Wave Refraction on Graphene |
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graphene |
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electron-wave lens |
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probabilistic system |
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1st Author's Name |
Shohei Hamada |
1st Author's Affiliation |
Hiroshima City University (Hiroshima City Univ.) |
2nd Author's Name |
Hisato Fujisaka |
2nd Author's Affiliation |
Hiroshima City University (Hiroshima City Univ.) |
3rd Author's Name |
Takeshi Kamio |
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Hiroshima City University (Hiroshima City Univ.) |
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Speaker |
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Date Time |
2015-10-05 16:30:00 |
Presentation Time |
25 minutes |
Registration for |
NLP |
Paper # |
CAS2015-32, NLP2015-93 |
Volume (vol) |
vol.115 |
Number (no) |
no.239(CAS), no.240(NLP) |
Page |
pp.59-63 |
#Pages |
5 |
Date of Issue |
2015-09-28 (CAS, NLP) |
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