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| Presentation | 2015-12-01 15:45 [Fellow Memorial Lecture] Improving System Dependability by VLSI Test Technology Seiji Kajihara (KIT)  VLD2015-44 CPM2015-128 ICD2015-53 CPSY2015-64 DC2015-40 RECONF2015-51 Link to ES Tech. Rep. Archives: CPM2015-128 ICD2015-53 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | VLSI Test technology for detection of manufacturing faults has been developed to improve test quality that is the capability of fault detection and to reduce test cost, and it has contributed to the spread of VLSIs and the improvement of system reliability. In this talk, recent test technology such as big data analysis using huge manufacturing test data and field test dealing with aging is introduced. And then, expectation to provide added value for enhancements of system dependability is described. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | VLSI test / system dependability / big data / field test / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 115, no. 342, CPSY2015-64, pp. 19-20, Dec. 2015. | |
| Paper # | CPSY2015-64 | |
| Date of Issue | 2015-11-24 (VLD, CPM, ICD, CPSY, DC, RECONF) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | VLD2015-44 CPM2015-128 ICD2015-53 CPSY2015-64 DC2015-40 RECONF2015-51 Link to ES Tech. Rep. Archives: CPM2015-128 ICD2015-53 |
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| Conference Information | |
| Committee | VLD DC IPSJ-SLDM CPSY RECONF ICD CPM |
| Conference Date | 2015-12-01 - 2015-12-03 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Nagasaki Kinro Fukushi Kaikan |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Design Gaia 2015 -New Field of VLSI Design- |
| Paper Information | |
| Registration To | CPSY |
| Conference Code | 2015-12-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Improving System Dependability by VLSI Test Technology |
| Sub Title (in English) | |
| Keyword(1) | VLSI test |
| Keyword(2) | system dependability |
| Keyword(3) | big data |
| Keyword(4) | field test |
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| 1st Author's Name | Seiji Kajihara |
| 1st Author's Affiliation | Kyushu Institute of Technology (KIT) |
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| Speaker | Author-1 |
| Date Time | 2015-12-01 15:45:00 |
| Presentation Time | 60 minutes |
| Registration for | CPSY |
| Paper # | VLD2015-44, CPM2015-128, ICD2015-53, CPSY2015-64, DC2015-40, RECONF2015-51 |
| Volume (vol) | vol.115 |
| Number (no) | no.338(VLD), no.340(CPM), no.341(ICD), no.342(CPSY), no.339(DC), no.343(RECONF) |
| Page | pp.43-44(VLD), pp.9-10(CPM), pp.9-10(ICD), pp.19-20(CPSY), pp.43-44(DC), pp.19-20(RECONF) |
| #Pages | 2 |
| Date of Issue | 2015-11-24 (VLD, CPM, ICD, CPSY, DC, RECONF) |
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