Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2015-12-11 14:25
Identification of loss factors using 1-um-band mode-detection OTDR
Atsushi Nakamura, Keiji Okamoto, Yusuke Koshikiya, Tetsuya Manabe, Manabu Oguma, Toshikazu Hashimoto, Mikitaka Itoh (NTT) OFT2015-48
Abstract (in Japanese) (See Japanese page) 
(in English) Optical fiber cables exposed to long-term severe environmental conditions can cause loss increases due to deterioration. These potential fault locations and the factors should be identified before communication signals are affected, and they should be repaired or replaced. In order to locate fiber bends with high sensitivity, we have recently proposed 1-um-band mode-detection OTDR, which enables us to individually observe the fundamental (LP01) and the second-order (LP11) modes of the backscattered light generated in the two-mode region of the fiber. In this paper, we propose a novel diagnostic technique for identifying loss factors by evaluating the loss ratio of the LP01 to LP11 modes of the backscattered light obtained with 1-um-band mode-detection OTDR.
Keyword (in Japanese) (See Japanese page) 
(in English) OTDR / Higher-order mode / Bending loss / Splice loss / Maintenance / / /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 360, OFT2015-48, pp. 13-16, Dec. 2015.
Paper # OFT2015-48 
Date of Issue 2015-12-04 (OFT) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF OFT2015-48

Conference Information
Committee OFT  
Conference Date 2015-12-11 - 2015-12-11 
Place (in Japanese) (See Japanese page) 
Place (in English) The University of Electro-Communications (Tokyo) 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To OFT 
Conference Code 2015-12-OFT 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Identification of loss factors using 1-um-band mode-detection OTDR 
Sub Title (in English)  
Keyword(1) OTDR  
Keyword(2) Higher-order mode  
Keyword(3) Bending loss  
Keyword(4) Splice loss  
Keyword(5) Maintenance  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Atsushi Nakamura  
1st Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
2nd Author's Name Keiji Okamoto  
2nd Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
3rd Author's Name Yusuke Koshikiya  
3rd Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
4th Author's Name Tetsuya Manabe  
4th Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
5th Author's Name Manabu Oguma  
5th Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
6th Author's Name Toshikazu Hashimoto  
6th Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
7th Author's Name Mikitaka Itoh  
7th Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2015-12-11 14:25:00 
Presentation Time 25 minutes 
Registration for OFT 
Paper # OFT2015-48 
Volume (vol) vol.115 
Number (no) no.360 
Page pp.13-16 
#Pages
Date of Issue 2015-12-04 (OFT) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan