Paper Abstract and Keywords |
Presentation |
2016-01-28 16:15
Quantitative Evaluation of Tamper Resistance for Random Number Masking Ryoma Matsuhisa, Masaya Yoshikawa (Meijo Univ.) CAS2015-70 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
When a cryptographic circuit is used, it is extremely important to verify its tamper resistance against side-channel attacks. Side-channel attacks illegally obtain confidential information using physical information, such as power consumption and electromagnetic waves generated during the encryption processing. In particular, power analysis attacks using power consumption can easily analyze confidential information. The masking is a typical measure against power analysis attacks. In this method, the correlation between power consumption and confidential information is masked by adding random numbers to intermediate data of encryption. However, there are no reports on relationship between the period and accuracy of the random number and the tamper resistance in the masking. This study verifies the tamper resistance of the masking using several random number generators. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Tamper Resistance / AES / Random Number Masking / Power Analysis Attack / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 115, no. 422, CAS2015-70, pp. 51-56, Jan. 2016. |
Paper # |
CAS2015-70 |
Date of Issue |
2016-01-21 (CAS) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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CAS2015-70 |
Conference Information |
Committee |
CAS |
Conference Date |
2016-01-28 - 2016-01-29 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
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(See Japanese page) |
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Paper Information |
Registration To |
CAS |
Conference Code |
2016-01-CAS |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Quantitative Evaluation of Tamper Resistance for Random Number Masking |
Sub Title (in English) |
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Tamper Resistance |
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AES |
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Random Number Masking |
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Power Analysis Attack |
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1st Author's Name |
Ryoma Matsuhisa |
1st Author's Affiliation |
Meijo University (Meijo Univ.) |
2nd Author's Name |
Masaya Yoshikawa |
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Meijo University (Meijo Univ.) |
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Speaker |
Author-1 |
Date Time |
2016-01-28 16:15:00 |
Presentation Time |
25 minutes |
Registration for |
CAS |
Paper # |
CAS2015-70 |
Volume (vol) |
vol.115 |
Number (no) |
no.422 |
Page |
pp.51-56 |
#Pages |
6 |
Date of Issue |
2016-01-21 (CAS) |
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