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Paper Abstract and Keywords
Presentation 2016-01-29 14:05
Dependence of Noise Tolerance on Depth of Learning in BPSK Label Processing Using Complex-Valued Neural-Network
Hanayo Fujimoto, Hiroki Kishikawa, Nobuo Goto, Shin-ichiro Yanagiya (Tokushima Univ) PN2015-95 EMT2015-146 OPE2015-208 LQE2015-195 EST2015-152 MWP2015-121
Abstract (in Japanese) (See Japanese page) 
(in English) Most of current network node use electronic processing which needs additional conversion between optical and electrical signals will become a bottleneck.In order to overcome the issue, all-optical label processing is expected to realize a high-speed label routing network. In this report, optical neural-network circuit to process BPSK labels for photonic label routing is proposed, It is found that noise tolerance for incident labels is improved by reducing the depth of learning for weights.
Keyword (in Japanese) (See Japanese page) 
(in English) optical neural network / label processing / noise tolerence / / / / /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 432, OPE2015-208, pp. 373-378, Jan. 2016.
Paper # OPE2015-208 
Date of Issue 2016-01-21 (PN, EMT, OPE, LQE, EST, MWP) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF PN2015-95 EMT2015-146 OPE2015-208 LQE2015-195 EST2015-152 MWP2015-121

Conference Information
Committee LQE EST OPE EMT PN MWP IEE-EMT PEM 
Conference Date 2016-01-28 - 2016-01-29 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To OPE 
Conference Code 2016-01-LQE-EST-OPE-EMT-PN-MWP-EMT-PEM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Dependence of Noise Tolerance on Depth of Learning in BPSK Label Processing Using Complex-Valued Neural-Network 
Sub Title (in English)  
Keyword(1) optical neural network  
Keyword(2) label processing  
Keyword(3) noise tolerence  
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1st Author's Name Hanayo Fujimoto  
1st Author's Affiliation Tokushima University (Tokushima Univ)
2nd Author's Name Hiroki Kishikawa  
2nd Author's Affiliation Tokushima University (Tokushima Univ)
3rd Author's Name Nobuo Goto  
3rd Author's Affiliation Tokushima University (Tokushima Univ)
4th Author's Name Shin-ichiro Yanagiya  
4th Author's Affiliation Tokushima University (Tokushima Univ)
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Speaker Author-1 
Date Time 2016-01-29 14:05:00 
Presentation Time 25 minutes 
Registration for OPE 
Paper # PN2015-95, EMT2015-146, OPE2015-208, LQE2015-195, EST2015-152, MWP2015-121 
Volume (vol) vol.115 
Number (no) no.430(PN), no.431(EMT), no.432(OPE), no.433(LQE), no.434(EST), no.435(MWP) 
Page pp.373-378 
#Pages 6 
Date of Issue 2016-01-21 (PN, EMT, OPE, LQE, EST, MWP) 

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