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Paper Abstract and Keywords
Presentation 2016-04-14 13:50
[Invited Lecture] Reliability Projecting for ReRAM based on Stochastic Differential Equation
Zhiqiang Wei (PSCS), Koji Eriguchi (Kyoto Univ.), Shunsaku Muraoka, Koji Katayama, Ryotaro Yasuhara, Kawai Ken, Yukio Hayakawa, Kazuhiko Shimakawa, Takumi Mikawa, Yoneda Shinichi (PSCS) ICD2016-7
Abstract (in Japanese) (See Japanese page) 
(in English) An analytic formula based on stochastic differential equation is successfully developed to describe intrinsic ReRAM variation. The formula is useful to predict scaled ReRAM memory window after retention, verified by testing 40 nm 2Mb memory array.
Keyword (in Japanese) (See Japanese page) 
(in English) Stochastic Differential Equation / Percolation hopping model / Filament / Retention / / / /  
Reference Info. IEICE Tech. Rep., vol. 116, no. 3, ICD2016-7, pp. 33-37, April 2016.
Paper # ICD2016-7 
Date of Issue 2016-04-07 (ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee ICD  
Conference Date 2016-04-14 - 2016-04-15 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ICD 
Conference Code 2016-04-ICD 
Language English (Japanese title is available) 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Reliability Projecting for ReRAM based on Stochastic Differential Equation 
Sub Title (in English)  
Keyword(1) Stochastic Differential Equation  
Keyword(2) Percolation hopping model  
Keyword(3) Filament  
Keyword(4) Retention  
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1st Author's Name Zhiqiang Wei  
1st Author's Affiliation 1Panasonic Semiconductor Solutions Co., Ltd., (PSCS)
2nd Author's Name Koji Eriguchi  
2nd Author's Affiliation Kyoto Univerisity (Kyoto Univ.)
3rd Author's Name Shunsaku Muraoka  
3rd Author's Affiliation 1Panasonic Semiconductor Solutions Co., Ltd., (PSCS)
4th Author's Name Koji Katayama  
4th Author's Affiliation 1Panasonic Semiconductor Solutions Co., Ltd., (PSCS)
5th Author's Name Ryotaro Yasuhara  
5th Author's Affiliation 1Panasonic Semiconductor Solutions Co., Ltd., (PSCS)
6th Author's Name Kawai Ken  
6th Author's Affiliation 1Panasonic Semiconductor Solutions Co., Ltd., (PSCS)
7th Author's Name Yukio Hayakawa  
7th Author's Affiliation 1Panasonic Semiconductor Solutions Co., Ltd., (PSCS)
8th Author's Name Kazuhiko Shimakawa  
8th Author's Affiliation 1Panasonic Semiconductor Solutions Co., Ltd., (PSCS)
9th Author's Name Takumi Mikawa  
9th Author's Affiliation 1Panasonic Semiconductor Solutions Co., Ltd., (PSCS)
10th Author's Name Yoneda Shinichi  
10th Author's Affiliation 1Panasonic Semiconductor Solutions Co., Ltd., (PSCS)
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Speaker Author-1 
Date Time 2016-04-14 13:50:00 
Presentation Time 25 minutes 
Registration for ICD 
Paper # ICD2016-7 
Volume (vol) vol.116 
Number (no) no.3 
Page pp.33-37 
#Pages 5 
Date of Issue 2016-04-07 (ICD) 

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