| Paper Abstract and Keywords |
| Presentation |
2016-04-14 11:00
[Invited Lecture]
A 298-fJ/writecycle 650-fJ/readcycle 8T Three-Port SRAM in 28-nm FD-SOI Process Technology for Image Processor Haruki Mori, Tomoki Nakagawa, Yuki Kitahara, Yuta Kawamoto, Kenta Takagi, Shusuke Yoshimoto, Shintaro Izumi (Kobe Univ.), Koji Nii (Renesas Electronics), Hiroshi Kawaguchi, Masahiko Yoshimoto (Kobe Univ.) ICD2016-3 |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
This paper presents a low-power and low-voltage 64-kb 8T three-port image memory using a 28-nm FD-SOI process technology. Our proposed SRAM accommodates eight-transistor bitcells comprising one-write/two-read ports and a majority logic circuit to save active energy. The test chip can operate at a supply voltage of 0.46 V and an access time of 140 ns. The energy minimum point is a supply voltage of 0.54 V and an access time of 55 ns (= 18.2 MHz), at which 298 fJ/cycle in a write operation and 650 fJ/cycle in a read operation are achieved with the help of the majority logic; these factor are 87% and 52% smaller than those in a 28-nm FD-SOI 6T SRAM. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
Image Memory / Multiport SRAM / 8T / FD-SOI / 28-nm / Majority Logic / / |
| Reference Info. |
IEICE Tech. Rep., vol. 116, no. 3, ICD2016-3, pp. 13-16, April 2016. |
| Paper # |
ICD2016-3 |
| Date of Issue |
2016-04-07 (ICD) |
| ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
| Download PDF |
ICD2016-3 |
| Conference Information |
| Committee |
ICD |
| Conference Date |
2016-04-14 - 2016-04-15 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
|
| Paper Information |
| Registration To |
ICD |
| Conference Code |
2016-04-ICD |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
A 298-fJ/writecycle 650-fJ/readcycle 8T Three-Port SRAM in 28-nm FD-SOI Process Technology for Image Processor |
| Sub Title (in English) |
|
| Keyword(1) |
Image Memory |
| Keyword(2) |
Multiport SRAM |
| Keyword(3) |
8T |
| Keyword(4) |
FD-SOI |
| Keyword(5) |
28-nm |
| Keyword(6) |
Majority Logic |
| Keyword(7) |
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| Keyword(8) |
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| 1st Author's Name |
Haruki Mori |
| 1st Author's Affiliation |
Kobe University (Kobe Univ.) |
| 2nd Author's Name |
Tomoki Nakagawa |
| 2nd Author's Affiliation |
Kobe University (Kobe Univ.) |
| 3rd Author's Name |
Yuki Kitahara |
| 3rd Author's Affiliation |
Kobe University (Kobe Univ.) |
| 4th Author's Name |
Yuta Kawamoto |
| 4th Author's Affiliation |
Kobe University (Kobe Univ.) |
| 5th Author's Name |
Kenta Takagi |
| 5th Author's Affiliation |
Kobe University (Kobe Univ.) |
| 6th Author's Name |
Shusuke Yoshimoto |
| 6th Author's Affiliation |
Kobe University (Kobe Univ.) |
| 7th Author's Name |
Shintaro Izumi |
| 7th Author's Affiliation |
Kobe University (Kobe Univ.) |
| 8th Author's Name |
Koji Nii |
| 8th Author's Affiliation |
Renesas Electronics Corporation (Renesas Electronics) |
| 9th Author's Name |
Hiroshi Kawaguchi |
| 9th Author's Affiliation |
Kobe University (Kobe Univ.) |
| 10th Author's Name |
Masahiko Yoshimoto |
| 10th Author's Affiliation |
Kobe University (Kobe Univ.) |
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| Speaker |
Author-1 |
| Date Time |
2016-04-14 11:00:00 |
| Presentation Time |
25 minutes |
| Registration for |
ICD |
| Paper # |
ICD2016-3 |
| Volume (vol) |
vol.116 |
| Number (no) |
no.3 |
| Page |
pp.13-16 |
| #Pages |
4 |
| Date of Issue |
2016-04-07 (ICD) |