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Paper Abstract and Keywords
Presentation 2016-06-02 13:33
[Poster Presentation] Study on Fault Sensitivity Analysis of Cryptographic Device under IEMI
Takuya Itoh (Tohoku Univ.), Yu-ichi Hayashi (Tohoku Gakuin Univ.), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2016-43
Abstract (in Japanese) (See Japanese page) 
(in English) The existing intentional electromagnetic interference (IEMI) fault injection method based on continuous sinusoidal waves has a difficulty in injecting faults at a specific operation or time. Therefore, it is not fully considered that an analytical methods for this fault injection method. In this paper, we propose a suitable analytical method for IEMI based fault injection method.
Keyword (in Japanese) (See Japanese page) 
(in English) Fault analysis / Intentional electromagnetic interference / FSA / / / / /  
Reference Info. IEICE Tech. Rep., vol. 116, no. 72, EMCJ2016-43, pp. 83-84, June 2016.
Paper # EMCJ2016-43 
Date of Issue 2016-05-26 (EMCJ) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMCJ IEE-EMC IEE-MAG  
Conference Date 2016-06-02 - 2016-06-03 
Place (in Japanese) (See Japanese page) 
Place (in English) NTU, Taiwan 
Topics (in Japanese) (See Japanese page) 
Topics (in English) EMC Joint Workshop, 2016, Taipei 
Paper Information
Registration To EMCJ 
Conference Code 2016-06-EMCJ-EMC-MAG 
Language English (Japanese title is available) 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Study on Fault Sensitivity Analysis of Cryptographic Device under IEMI 
Sub Title (in English)  
Keyword(1) Fault analysis  
Keyword(2) Intentional electromagnetic interference  
Keyword(3) FSA  
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1st Author's Name Takuya Itoh  
1st Author's Affiliation Tohoku University (Tohoku Univ.)
2nd Author's Name Yu-ichi Hayashi  
2nd Author's Affiliation Tohoku Gakuin University (Tohoku Gakuin Univ.)
3rd Author's Name Takaaki Mizuki  
3rd Author's Affiliation Tohoku University (Tohoku Univ.)
4th Author's Name Hideaki Sone  
4th Author's Affiliation Tohoku University (Tohoku Univ.)
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Speaker Author-1 
Date Time 2016-06-02 13:33:00 
Presentation Time 3 minutes 
Registration for EMCJ 
Paper # EMCJ2016-43 
Volume (vol) vol.116 
Number (no) no.72 
Page pp.83-84 
#Pages
Date of Issue 2016-05-26 (EMCJ) 


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