Paper Abstract and Keywords |
Presentation |
2016-08-03 14:15
Impacts of Flexible V_th control and Low Process Variability of SOTB to Ultra-low Voltage Designs Yasuhiro Ogasahara (AIST) SDM2016-65 ICD2016-33 Link to ES Tech. Rep. Archives: SDM2016-65 ICD2016-33 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
This paper discusses impacts of flexible Vth control, low process variability, and steep SS with small on-current of new structure devices on ultra-low voltage circuits. Our simulation results based on PTM 22nm model clarify applicability of ultra-low voltage operation to a nominal speed common SoC designs by an introduction of Vth control as well as low power sensor nodes. We also reveal requirement of process variability suppression for high energy efficiency with steep SS transistors. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
process variability / adaptive body bias / ultra-low voltage circuits / energy efficiency / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 116, no. 173, ICD2016-33, pp. 111-116, Aug. 2016. |
Paper # |
ICD2016-33 |
Date of Issue |
2016-07-25 (SDM, ICD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
SDM2016-65 ICD2016-33 Link to ES Tech. Rep. Archives: SDM2016-65 ICD2016-33 |
Conference Information |
Committee |
ICD SDM ITE-IST |
Conference Date |
2016-08-01 - 2016-08-03 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Central Electric Club |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low voltage/low power techniques, novel devices, circuits, and applications |
Paper Information |
Registration To |
ICD |
Conference Code |
2016-08-ICD-SDM-IST |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Impacts of Flexible V_th control and Low Process Variability of SOTB to Ultra-low Voltage Designs |
Sub Title (in English) |
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process variability |
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adaptive body bias |
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ultra-low voltage circuits |
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energy efficiency |
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1st Author's Name |
Yasuhiro Ogasahara |
1st Author's Affiliation |
National Institute of Advanced Industrial Science and Technology (AIST) |
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Speaker |
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Date Time |
2016-08-03 14:15:00 |
Presentation Time |
25 minutes |
Registration for |
ICD |
Paper # |
SDM2016-65, ICD2016-33 |
Volume (vol) |
vol.116 |
Number (no) |
no.172(SDM), no.173(ICD) |
Page |
pp.111-116 |
#Pages |
6 |
Date of Issue |
2016-07-25 (SDM, ICD) |
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