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Paper Abstract and Keywords
Presentation 2016-08-03 14:15
Impacts of Flexible V_th control and Low Process Variability of SOTB to Ultra-low Voltage Designs
Yasuhiro Ogasahara (AIST) SDM2016-65 ICD2016-33
Abstract (in Japanese) (See Japanese page) 
(in English) This paper discusses impacts of flexible Vth control, low process variability, and steep SS with small on-current of new structure devices on ultra-low voltage circuits. Our simulation results based on PTM 22nm model clarify applicability of ultra-low voltage operation to a nominal speed common SoC designs by an introduction of Vth control as well as low power sensor nodes. We also reveal requirement of process variability suppression for high energy efficiency with steep SS transistors.
Keyword (in Japanese) (See Japanese page) 
(in English) process variability / adaptive body bias / ultra-low voltage circuits / energy efficiency / / / /  
Reference Info. IEICE Tech. Rep., vol. 116, no. 173, ICD2016-33, pp. 111-116, Aug. 2016.
Paper # ICD2016-33 
Date of Issue 2016-07-25 (SDM, ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SDM2016-65 ICD2016-33

Conference Information
Committee ICD SDM ITE-IST  
Conference Date 2016-08-01 - 2016-08-03 
Place (in Japanese) (See Japanese page) 
Place (in English) Central Electric Club 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low voltage/low power techniques, novel devices, circuits, and applications 
Paper Information
Registration To ICD 
Conference Code 2016-08-ICD-SDM-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Impacts of Flexible V_th control and Low Process Variability of SOTB to Ultra-low Voltage Designs 
Sub Title (in English)  
Keyword(1) process variability  
Keyword(2) adaptive body bias  
Keyword(3) ultra-low voltage circuits  
Keyword(4) energy efficiency  
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1st Author's Name Yasuhiro Ogasahara  
1st Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
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Speaker Author-1 
Date Time 2016-08-03 14:15:00 
Presentation Time 25 minutes 
Registration for ICD 
Paper # SDM2016-65, ICD2016-33 
Volume (vol) vol.116 
Number (no) no.172(SDM), no.173(ICD) 
Page pp.111-116 
#Pages 6 
Date of Issue 2016-07-25 (SDM, ICD) 

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