Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2016-11-17 14:00
Estimation of three parameters of Weibull distribution by a discretization mdel
Kenji Uogishi R2016-49
Abstract (in Japanese) (See Japanese page) 
(in English) It is divided in fixed period of time such as days or months and the statistics information that the observation numerical value of the object is shown in each section in made the target . The Weibull distribution is assumed as a distribution function of a phenomenon here, and the way to estimate the 3-parameter is described from information which consists of observation J(J=1,2,…,K), the sale number nJ , target phenomenon rJ (and censored number nc).
Keyword (in Japanese) (See Japanese page) 
(in English) Weibull distribution / 3-parameter / / / / / /  
Reference Info. IEICE Tech. Rep., vol. 116, no. 301, R2016-49, pp. 1-6, Nov. 2016.
Paper # R2016-49 
Date of Issue 2016-11-10 (R) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2016-49

Conference Information
Committee R  
Conference Date 2016-11-17 - 2016-11-17 
Place (in Japanese) (See Japanese page) 
Place (in English) Osaka Central Electric Club Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Reliability for semiconductors and electronics devices, Overall reliability engineering (co-organized by Reliability Engineering Association of Japan Kansai Branch) 
Paper Information
Registration To R 
Conference Code 2016-11-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Estimation of three parameters of Weibull distribution by a discretization mdel 
Sub Title (in English)  
Keyword(1) Weibull distribution  
Keyword(2) 3-parameter  
Keyword(3)  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Kenji Uogishi  
1st Author's Affiliation * (*)
2nd Author's Name  
2nd Author's Affiliation ()
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2016-11-17 14:00:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2016-49 
Volume (vol) vol.116 
Number (no) no.301 
Page pp.1-6 
#Pages
Date of Issue 2016-11-10 (R) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan