| Paper Abstract and Keywords |
| Presentation |
2016-11-17 14:00
Estimation of three parameters of Weibull distribution by a discretization mdel Kenji Uogishi R2016-49 |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
It is divided in fixed period of time such as days or months and the statistics information that the observation numerical value of the object is shown in each section in made the target . The Weibull distribution is assumed as a distribution function of a phenomenon here, and the way to estimate the 3-parameter is described from information which consists of observation J(J=1,2,…,K), the sale number nJ , target phenomenon rJ (and censored number nc). |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
Weibull distribution / 3-parameter / / / / / / |
| Reference Info. |
IEICE Tech. Rep., vol. 116, no. 301, R2016-49, pp. 1-6, Nov. 2016. |
| Paper # |
R2016-49 |
| Date of Issue |
2016-11-10 (R) |
| ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
| Download PDF |
R2016-49 |
| Conference Information |
| Committee |
R |
| Conference Date |
2016-11-17 - 2016-11-17 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Osaka Central Electric Club Bldg. |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
Reliability for semiconductors and electronics devices, Overall reliability engineering (co-organized by Reliability Engineering Association of Japan Kansai Branch) |
| Paper Information |
| Registration To |
R |
| Conference Code |
2016-11-R |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Estimation of three parameters of Weibull distribution by a discretization mdel |
| Sub Title (in English) |
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| Keyword(1) |
Weibull distribution |
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3-parameter |
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| 1st Author's Name |
Kenji Uogishi |
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| Speaker |
Author-1 |
| Date Time |
2016-11-17 14:00:00 |
| Presentation Time |
25 minutes |
| Registration for |
R |
| Paper # |
R2016-49 |
| Volume (vol) |
vol.116 |
| Number (no) |
no.301 |
| Page |
pp.1-6 |
| #Pages |
6 |
| Date of Issue |
2016-11-10 (R) |