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Paper Abstract and Keywords
Presentation 2016-11-17 15:55
The effect of high gray-scale resolution for the high observation performance in X-ray inspection systems
Teruo Shibano (MELCO) R2016-53
Abstract (in Japanese) (See Japanese page) 
(in English) In recent X-ray fluoroscopic inspection devices, the performances of the X-ray camera device are improved, they are bigger screen size, higher resolution, and higher gray-scale performance obtained by increasing the numerical number of bits of data. In present situation, this high gray-scale performance is low degree of attention compared with other performance improvement, but this performance brings about the effect of greatly improving its ability in the X-ray fluoroscopic observation of parts and materials. In this report, the observation of semiconductor Al wiring and crack failures of multilayer ceramic capacitor, they are difficult to observe in the conventional X-ray fluoroscopy inspection devices, are done in two X-ray fluoroscopic inspection devices that one is 8-bit gray-scale device and another one is 16-bit gray-scale device. From the comparison of the observation results, it is explained that the high gray-scale performance improves the observation performance. In addition, the visualization of resin flow in the resin molded parts obtained by the high gray-scale performance is also reported.
Keyword (in Japanese) (See Japanese page) 
(in English) X-ray fluoroscopy / high gray-scale / Al wire bonding / multilayer ceramic capacitor / resin flow observation / / /  
Reference Info. IEICE Tech. Rep., vol. 116, no. 301, R2016-53, pp. 23-28, Nov. 2016.
Paper # R2016-53 
Date of Issue 2016-11-10 (R) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2016-53

Conference Information
Committee R  
Conference Date 2016-11-17 - 2016-11-17 
Place (in Japanese) (See Japanese page) 
Place (in English) Osaka Central Electric Club Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Reliability for semiconductors and electronics devices, Overall reliability engineering (co-organized by Reliability Engineering Association of Japan Kansai Branch) 
Paper Information
Registration To R 
Conference Code 2016-11-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) The effect of high gray-scale resolution for the high observation performance in X-ray inspection systems 
Sub Title (in English)  
Keyword(1) X-ray fluoroscopy  
Keyword(2) high gray-scale  
Keyword(3) Al wire bonding  
Keyword(4) multilayer ceramic capacitor  
Keyword(5) resin flow observation  
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1st Author's Name Teruo Shibano  
1st Author's Affiliation Mitsubishi Electirc Corporation (MELCO)
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Speaker Author-1 
Date Time 2016-11-17 15:55:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2016-53 
Volume (vol) vol.116 
Number (no) no.301 
Page pp.23-28 
#Pages 6 
Date of Issue 2016-11-10 (R) 

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