| IEICE Technical Committee Submission System Conference Paper's Information |
Online Proceedings [Sign in] Tech. Rep. Archives |
| Go Top Page | Go Previous | [Japanese] / [English] |
| Paper Abstract and Keywords | ||
| Presentation | 2016-11-28 15:05 Evaluation of Soft Error Rates of FlipFlops on FDSOI by Heavy Ions Masashi Hifumi, Shigehiro Umehara, Haruki Maruoka, Jun Furuta, Kazutoshi Kobayashi (KIT)  VLD2016-51 DC2016-45 |
|
| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | We evaluate tolerance for soft errors of FFs on a 28/65 nm FDSOI. We fabricated three different layouts of non-redundant FFs with same circuit area and, carried out heavy-ion measurement. Radiation hardbess is influenced by layout structures. Heavy ion irradiation reveals that the separated diffusion layout structure in 28 nm have 2x more cross section than shared diffusion one by the irradation of 40 MeV-cm2/mg ions. Flip-flops in 65 nm have almost equivalent cross sections at any energies. It is due to flucations of soft error tolerance caused by effects of layout structures of more scaled 28 nm node. |
|
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Soft Error / Heavy Ion / FDSOI / Flip Flop / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 116, no. 330, VLD2016-51, pp. 43-48, Nov. 2016. | |
| Paper # | VLD2016-51 | |
| Date of Issue | 2016-11-21 (VLD, DC) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | VLD2016-51 DC2016-45 |
|
| Conference Information | |
| Committee | VLD DC CPSY RECONF CPM ICD IE |
| Conference Date | 2016-11-28 - 2016-11-30 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Ritsumeikan University, Osaka Ibaraki Campus |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Design Gaia 2016 -New Field of VLSI Design- |
| Paper Information | |
| Registration To | VLD |
| Conference Code | 2016-11-VLD-DC-CPSY-RECONF-CPM-ICD-IE |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Evaluation of Soft Error Rates of FlipFlops on FDSOI by Heavy Ions |
| Sub Title (in English) | |
| Keyword(1) | Soft Error |
| Keyword(2) | Heavy Ion |
| Keyword(3) | FDSOI |
| Keyword(4) | Flip Flop |
| Keyword(5) | |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Masashi Hifumi |
| 1st Author's Affiliation | Kyoto Institute of Technology (KIT) |
| 2nd Author's Name | Shigehiro Umehara |
| 2nd Author's Affiliation | Kyoto Institute of Technology (KIT) |
| 3rd Author's Name | Haruki Maruoka |
| 3rd Author's Affiliation | Kyoto Institute of Technology (KIT) |
| 4th Author's Name | Jun Furuta |
| 4th Author's Affiliation | Kyoto Institute of Technology (KIT) |
| 5th Author's Name | Kazutoshi Kobayashi |
| 5th Author's Affiliation | Kyoto Institute of Technology (KIT) |
| 6th Author's Name | |
| 6th Author's Affiliation | () |
| Speaker | Author-1 |
| Date Time | 2016-11-28 15:05:00 |
| Presentation Time | 25 minutes |
| Registration for | VLD |
| Paper # | VLD2016-51, DC2016-45 |
| Volume (vol) | vol.116 |
| Number (no) | no.330(VLD), no.331(DC) |
| Page | pp.43-48 |
| #Pages | 6 |
| Date of Issue | 2016-11-21 (VLD, DC) |
[Return to Top Page]