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| Presentation | 2016-11-30 11:45 Keypoint Detection based on Learning to Rank for Robust Image Matching under Resolution Variation Satoshi Yoshikawa, Keisuke Kameyama (Univ. of Tsukuba)  CPM2016-85 ICD2016-46 IE2016-80 Link to ES Tech. Rep. Archives: CPM2016-85 ICD2016-46 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | The image matching by keypoint selection from images is used in various situations in computer vision. Among them, Scale-Invariant Feature Transform (SIFT), has been widely used for the feature extraction. However, when the resolutions of the matched images differ, solving keypoint correspondences become difficult. In this work, we propose a method to detect keypoints that are robust to scale changes. Based on RankSIFT by Li et al., Gaussian Scale Space (GSS) and scale features of each feature point are used to estimate their robustness against scaling. In addition, we proposed the method that predict the stability of keypoints by regression, and compared with the previous method based on RankSIFT. The proposed method proved to be effective in finding a small set of points that persist through scaling. |
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| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Keypoint Detection / Image Matching / SIFT / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 116, no. 335, IE2016-80, pp. 45-50, Nov. 2016. | |
| Paper # | IE2016-80 | |
| Date of Issue | 2016-11-22 (CPM, ICD, IE) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | CPM2016-85 ICD2016-46 IE2016-80 Link to ES Tech. Rep. Archives: CPM2016-85 ICD2016-46 |
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| Conference Information | |
| Committee | VLD DC CPSY RECONF CPM ICD IE |
| Conference Date | 2016-11-28 - 2016-11-30 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Ritsumeikan University, Osaka Ibaraki Campus |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Design Gaia 2016 -New Field of VLSI Design- |
| Paper Information | |
| Registration To | IE |
| Conference Code | 2016-11-VLD-DC-CPSY-RECONF-CPM-ICD-IE |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Keypoint Detection based on Learning to Rank for Robust Image Matching under Resolution Variation |
| Sub Title (in English) | |
| Keyword(1) | Keypoint Detection |
| Keyword(2) | Image Matching |
| Keyword(3) | SIFT |
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| 1st Author's Name | Satoshi Yoshikawa |
| 1st Author's Affiliation | University of Tsukuba (Univ. of Tsukuba) |
| 2nd Author's Name | Keisuke Kameyama |
| 2nd Author's Affiliation | University of Tsukuba (Univ. of Tsukuba) |
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| Speaker | Author-1 |
| Date Time | 2016-11-30 11:45:00 |
| Presentation Time | 25 minutes |
| Registration for | IE |
| Paper # | CPM2016-85, ICD2016-46, IE2016-80 |
| Volume (vol) | vol.116 |
| Number (no) | no.333(CPM), no.334(ICD), no.335(IE) |
| Page | pp.45-50 |
| #Pages | 6 |
| Date of Issue | 2016-11-22 (CPM, ICD, IE) |
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