| Paper Abstract and Keywords |
| Presentation |
2016-12-12 16:15
Characterization of planar synapses with GTO thin films Keisuke Ikushima, Kenta Umeda, Tokiyoshi Matsuda, Mutsumi Kimura (Ryukoku Univ.) EID2016-27 SDM2016-108 |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
Neural networks are information processing models based on the human brain, and they have been activity studied.
However, it is necessary to cases the high integration in order to sophisticate leaning neural network hardware.
In this study, we fabricated synapses of the neural network using the GTO thin films.
The synapses is plannar type, and it is assumed that they are stacked on the LSI surface.
It was found that the synapses have a degradation characteristic that can be applied to modify Hebbian leaning rule. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
Oxide semiconductor / Synapses / LSI / Neural network / / / / |
| Reference Info. |
IEICE Tech. Rep., vol. 116, no. 355, SDM2016-108, pp. 81-84, Dec. 2016. |
| Paper # |
SDM2016-108 |
| Date of Issue |
2016-12-05 (EID, SDM) |
| ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
| Download PDF |
EID2016-27 SDM2016-108 |
| Conference Information |
| Committee |
SDM EID |
| Conference Date |
2016-12-12 - 2016-12-12 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
NAIST |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
Fabrication and Evaluation of Silicon Related Materials |
| Paper Information |
| Registration To |
SDM |
| Conference Code |
2016-12-SDM-EID |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Characterization of planar synapses with GTO thin films |
| Sub Title (in English) |
|
| Keyword(1) |
Oxide semiconductor |
| Keyword(2) |
Synapses |
| Keyword(3) |
LSI |
| Keyword(4) |
Neural network |
| Keyword(5) |
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| Keyword(6) |
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| 1st Author's Name |
Keisuke Ikushima |
| 1st Author's Affiliation |
Ryukoku University (Ryukoku Univ.) |
| 2nd Author's Name |
Kenta Umeda |
| 2nd Author's Affiliation |
Ryukoku University (Ryukoku Univ.) |
| 3rd Author's Name |
Tokiyoshi Matsuda |
| 3rd Author's Affiliation |
Ryukoku University (Ryukoku Univ.) |
| 4th Author's Name |
Mutsumi Kimura |
| 4th Author's Affiliation |
Ryukoku University (Ryukoku Univ.) |
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| Speaker |
Author-1 |
| Date Time |
2016-12-12 16:15:00 |
| Presentation Time |
15 minutes |
| Registration for |
SDM |
| Paper # |
EID2016-27, SDM2016-108 |
| Volume (vol) |
vol.116 |
| Number (no) |
no.354(EID), no.355(SDM) |
| Page |
pp.81-84 |
| #Pages |
4 |
| Date of Issue |
2016-12-05 (EID, SDM) |