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Paper Abstract and Keywords
Presentation 2016-12-15 15:30
[Poster Presentation] Error Analysis of NAND Flash Memories for Long-Term Storage
Kyoji Mizoguchi, Tomonori Takahashi, Seiichi Aritome, Ken Takeuchi (Chuo Univ.) ICD2016-72 CPSY2016-78
Abstract (in Japanese) (See Japanese page) 
(in English) Recently, a digital data on art, culture and history which required data-retention (DR) time from 10 to 100 years or more has been rapidly increased. NAND flash memory is expected as one of long-term data storage devices. In NAND flash memory, the reliability trade-off exists between DR time and write/erase (W/E) cycles. Therefore, to achieve long-term DR, W/E cycles are restricted. In addition, the error tendency depends on the retention temperature and W/E cycles. This paper investigated the error tendency on different retention condition in Triple-level cell (TLC, 3bit /cell) NAND flash memory which is applied low W/E cycles.
Keyword (in Japanese) (See Japanese page) 
(in English) NAND flash memory / archive / / / / / /  
Reference Info. IEICE Tech. Rep., vol. 116, no. 364, ICD2016-72, pp. 63-63, Dec. 2016.
Paper # ICD2016-72 
Date of Issue 2016-12-08 (ICD, CPSY) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee ICD CPSY  
Conference Date 2016-12-15 - 2016-12-16 
Place (in Japanese) (See Japanese page) 
Place (in English) Tokyo Institute of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ICD 
Conference Code 2016-12-ICD-CPSY 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Error Analysis of NAND Flash Memories for Long-Term Storage 
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Keyword(1) NAND flash memory  
Keyword(2) archive  
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1st Author's Name Kyoji Mizoguchi  
1st Author's Affiliation Chuo University (Chuo Univ.)
2nd Author's Name Tomonori Takahashi  
2nd Author's Affiliation Chuo University (Chuo Univ.)
3rd Author's Name Seiichi Aritome  
3rd Author's Affiliation Chuo University (Chuo Univ.)
4th Author's Name Ken Takeuchi  
4th Author's Affiliation Chuo University (Chuo Univ.)
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Speaker Author-1 
Date Time 2016-12-15 15:30:00 
Presentation Time 120 minutes 
Registration for ICD 
Paper # ICD2016-72, CPSY2016-78 
Volume (vol) vol.116 
Number (no) no.364(ICD), no.365(CPSY) 
Page p.63 
#Pages 1 
Date of Issue 2016-12-08 (ICD, CPSY) 

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