Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2017-01-19 13:50
Size Reduction of Scale Model for Propagation Loss in Microcell
Shinichi Ichitsubo, Kazuya Kurisu (Kyutech) AP2016-132
Abstract (in Japanese) (See Japanese page) 
(in English) We are examining the scale model method for the propagation loss in microcell environment. Until now, the scale models of the scale of 1/70 to 1/350 were produced for the residential area, and a propagation loss of real environment and that of scale model were compared. It is clear that the error of the propagation loss obtained from a scale model becomes large when the scale of a scale model is enlarged. Since the penetration losses of a block for a scale model are insufficient, the blocks with a large penetration loss were produced. The scale model of 1/160 and 1/350 using these blocks were produced, and the error was examined. An error becomes small as a result of measurement, and it is clear that the scale model of 1/160 or 1/350 can also reproduce a propagation loss.
Keyword (in Japanese) (See Japanese page) 
(in English) Radio Propagation / Propagation loss / Scale model / Microcell / / / /  
Reference Info. IEICE Tech. Rep., vol. 116, no. 397, AP2016-132, pp. 17-20, Jan. 2017.
Paper # AP2016-132 
Date of Issue 2017-01-12 (AP) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF AP2016-132

Conference Information
Committee AP WPT  
Conference Date 2017-01-19 - 2017-01-20 
Place (in Japanese) (See Japanese page) 
Place (in English) Hiroshima Institute of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Wireless transmission technology, Radio propagation, Antennas and Propagation 
Paper Information
Registration To AP 
Conference Code 2017-01-AP-WPT 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Size Reduction of Scale Model for Propagation Loss in Microcell 
Sub Title (in English)  
Keyword(1) Radio Propagation  
Keyword(2) Propagation loss  
Keyword(3) Scale model  
Keyword(4) Microcell  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Shinichi Ichitsubo  
1st Author's Affiliation Kyushu Institute of Technology (Kyutech)
2nd Author's Name Kazuya Kurisu  
2nd Author's Affiliation Kyushu Institute of Technology (Kyutech)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2017-01-19 13:50:00 
Presentation Time 20 minutes 
Registration for AP 
Paper # AP2016-132 
Volume (vol) vol.116 
Number (no) no.397 
Page pp.17-20 
#Pages
Date of Issue 2017-01-12 (AP) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan