IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2017-01-19 18:35
Reliability Evaluation of R-R Interval Measurement Status using the Electric Potential Characteristics of QRS Complex for Wearable ECG Devices
Kana Eguchi, Ryosuke Aoki, Kazuhiro Yoshida, Tomohiro Yamada (NTT) PRMU2016-140 MVE2016-31
Abstract (in Japanese) (See Japanese page) 
(in English) Electrocardiogram (ECG) captured by wearable ECG devices easily contains artifact because of the measurement faults. Since frequency characteristics of artifact are quite similar to the ones of R waves, it may cause R-R Interval (RRI) miscalculation. To enable accurate Heart Rate Variability (HRV) analysis in daily life, this paper proposes reliability evaluation method of RRI measurement status which uses the electric potential characteristics of QRS complex. The proposed method consists of two steps; discrimination of R wave measurement status, and reliability evaluation of RRI measurement status based on the combination of those results of two consecutive R waves. The results of the initial evaluation show that the proposed method has the potential to distinguish miscalculated RRIs. Moreover, time domain measures of HRV derived from the proposed RRI outlier exclusion method are more accurate than those derived from the conventional one. As a pilot test of the visualization, this paper reports the colored Lorenz plot which reflects RRI measurement status reliability.
Keyword (in Japanese) (See Japanese page) 
(in English) Wearable / Electrocardiogram(ECG) / Measurement fault / Electric potential / R-R Interval(RRI) / Heart Rate Variability(HRV) analysis / Reliability / Visualization  
Reference Info. IEICE Tech. Rep., vol. 116, no. 412, MVE2016-31, pp. 171-176, Jan. 2017.
Paper # MVE2016-31 
Date of Issue 2017-01-12 (PRMU, MVE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF PRMU2016-140 MVE2016-31

Conference Information
Committee PRMU IPSJ-CVIM MVE  
Conference Date 2017-01-19 - 2017-01-20 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To MVE 
Conference Code 2017-01-PRMU-CVIM-MVE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Reliability Evaluation of R-R Interval Measurement Status using the Electric Potential Characteristics of QRS Complex for Wearable ECG Devices 
Sub Title (in English)  
Keyword(1) Wearable  
Keyword(2) Electrocardiogram(ECG)  
Keyword(3) Measurement fault  
Keyword(4) Electric potential  
Keyword(5) R-R Interval(RRI)  
Keyword(6) Heart Rate Variability(HRV) analysis  
Keyword(7) Reliability  
Keyword(8) Visualization  
1st Author's Name Kana Eguchi  
1st Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
2nd Author's Name Ryosuke Aoki  
2nd Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
3rd Author's Name Kazuhiro Yoshida  
3rd Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
4th Author's Name Tomohiro Yamada  
4th Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2017-01-19 18:35:00 
Presentation Time 25 minutes 
Registration for MVE 
Paper # PRMU2016-140, MVE2016-31 
Volume (vol) vol.116 
Number (no) no.411(PRMU), no.412(MVE) 
Page pp.171-176 
#Pages
Date of Issue 2017-01-12 (PRMU, MVE) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan