IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2017-01-20 09:00
Experimental Measurement of the V2I Beacon Propagation Performance of In-Vehicle Wi-SUN Devices towards a Smart and Safe City
Kiyohide Nakauchi (NICT), Shizuka Tamura, Satoru Ikeda, Shunsuke Uchi (Fujitsu Ten), Yozo Shoji (NICT) ASN2016-80
Abstract (in Japanese) (See Japanese page) 
(in English) (Not available yet)
Keyword (in Japanese) (See Japanese page) 
(in English) / / / / / / /  
Reference Info. IEICE Tech. Rep., vol. 116, no. 407, ASN2016-80, pp. 53-58, Jan. 2017.
Paper # ASN2016-80 
Date of Issue 2017-01-12 (ASN) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ASN2016-80

Conference Information
Committee ASN MoNA MICT  
Conference Date 2017-01-19 - 2017-01-20 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ASN 
Conference Code 2017-01-ASN-MoNA-MICT 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Experimental Measurement of the V2I Beacon Propagation Performance of In-Vehicle Wi-SUN Devices towards a Smart and Safe City 
Sub Title (in English)  
1st Author's Name Kiyohide Nakauchi  
1st Author's Affiliation NICT (NICT)
2nd Author's Name Shizuka Tamura  
2nd Author's Affiliation Fujitsu Ten, Ltd. (Fujitsu Ten)
3rd Author's Name Satoru Ikeda  
3rd Author's Affiliation Fujitsu Ten, Ltd. (Fujitsu Ten)
4th Author's Name Shunsuke Uchi  
4th Author's Affiliation Fujitsu Ten, Ltd. (Fujitsu Ten)
5th Author's Name Yozo Shoji  
5th Author's Affiliation NICT (NICT)
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Date Time 2017-01-20 09:00:00 
Presentation Time 25 
Registration for ASN 
Paper # ASN2016-80 
Volume (vol) 116 
Number (no) no.407 
Page pp.53-58 
Date of Issue 2017-01-12 (ASN) 

[Return to Top Page]

[Return to IEICE Web Page]

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan