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Paper Abstract and Keywords
Presentation 2017-04-21 11:00
[Invited Lecture] Highly reliable Cu atom switch using thermally tolerant Polymer-solid Electrolyte (TT-PSE) for Nonvolatile Programmable Logic
Koichiro Okamoto, Munehiro Tada, Naoki Banno, Noriyuki Iguchi, Hiromitsu Hada, Toshitsugu Sakamoto, Makoto Miyamura, Yukihide Tsuji, Ryusuke Nebashi, Ayuka Morioka, Xu Bai, Tadahiko Sugibayashi (NEC) ICD2017-13
Abstract (in Japanese) (See Japanese page) 
(in English) Robust Cu atom switch with higher operation reliability has been developed featuring an over-400C thermally tolerant polymer-solid electrolyte (TT-PSE).The improved thermal tolerance of PSE enables atom switch integration using standard Cu-BEOL (fully 400oC) process. The TT-PSE also gives higher breakdown voltage (+1V) with keeping low set voltage (2V). Data retention characteristics after thermal cycle stress at temperature ranging from -65 to 150C for 1000 cycles are also confirmed for the first time. The developed atom switch is to be a technology enabler of reliable reprogrammable logics for future applications operated at high temperatures.
Keyword (in Japanese) (See Japanese page) 
(in English) Atom switch / Crossbar / Nonvolatile programmable logic / / / / /  
Reference Info. IEICE Tech. Rep., vol. 117, no. 9, ICD2017-13, pp. 67-72, April 2017.
Paper # ICD2017-13 
Date of Issue 2017-04-13 (ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee ICD  
Conference Date 2017-04-20 - 2017-04-21 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ICD 
Conference Code 2017-04-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Highly reliable Cu atom switch using thermally tolerant Polymer-solid Electrolyte (TT-PSE) for Nonvolatile Programmable Logic 
Sub Title (in English)  
Keyword(1) Atom switch  
Keyword(2) Crossbar  
Keyword(3) Nonvolatile programmable logic  
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1st Author's Name Koichiro Okamoto  
1st Author's Affiliation NEC Corporation (NEC)
2nd Author's Name Munehiro Tada  
2nd Author's Affiliation NEC Corporation (NEC)
3rd Author's Name Naoki Banno  
3rd Author's Affiliation NEC Corporation (NEC)
4th Author's Name Noriyuki Iguchi  
4th Author's Affiliation NEC Corporation (NEC)
5th Author's Name Hiromitsu Hada  
5th Author's Affiliation NEC Corporation (NEC)
6th Author's Name Toshitsugu Sakamoto  
6th Author's Affiliation NEC Corporation (NEC)
7th Author's Name Makoto Miyamura  
7th Author's Affiliation NEC Corporation (NEC)
8th Author's Name Yukihide Tsuji  
8th Author's Affiliation NEC Corporation (NEC)
9th Author's Name Ryusuke Nebashi  
9th Author's Affiliation NEC Corporation (NEC)
10th Author's Name Ayuka Morioka  
10th Author's Affiliation NEC Corporation (NEC)
11th Author's Name Xu Bai  
11th Author's Affiliation NEC Corporation (NEC)
12th Author's Name Tadahiko Sugibayashi  
12th Author's Affiliation NEC Corporation (NEC)
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Speaker Author-1 
Date Time 2017-04-21 11:00:00 
Presentation Time 25 minutes 
Registration for ICD 
Paper # ICD2017-13 
Volume (vol) vol.117 
Number (no) no.9 
Page pp.67-72 
#Pages 6 
Date of Issue 2017-04-13 (ICD) 

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