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| Presentation | 2017-04-21 11:00 [Invited Lecture] Highly reliable Cu atom switch using thermally tolerant Polymer-solid Electrolyte (TT-PSE) for Nonvolatile Programmable Logic Koichiro Okamoto, Munehiro Tada, Naoki Banno, Noriyuki Iguchi, Hiromitsu Hada, Toshitsugu Sakamoto, Makoto Miyamura, Yukihide Tsuji, Ryusuke Nebashi, Ayuka Morioka, Xu Bai, Tadahiko Sugibayashi (NEC)  ICD2017-13 Link to ES Tech. Rep. Archives: ICD2017-13 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Robust Cu atom switch with higher operation reliability has been developed featuring an over-400C thermally tolerant polymer-solid electrolyte (TT-PSE).The improved thermal tolerance of PSE enables atom switch integration using standard Cu-BEOL (fully 400oC) process. The TT-PSE also gives higher breakdown voltage (+1V) with keeping low set voltage (2V). Data retention characteristics after thermal cycle stress at temperature ranging from -65 to 150C for 1000 cycles are also confirmed for the first time. The developed atom switch is to be a technology enabler of reliable reprogrammable logics for future applications operated at high temperatures. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Atom switch / Crossbar / Nonvolatile programmable logic / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 117, no. 9, ICD2017-13, pp. 67-72, April 2017. | |
| Paper # | ICD2017-13 | |
| Date of Issue | 2017-04-13 (ICD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
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| Download PDF | ICD2017-13 Link to ES Tech. Rep. Archives: ICD2017-13 |
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| Conference Information | |
| Committee | ICD |
| Conference Date | 2017-04-20 - 2017-04-21 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | ICD |
| Conference Code | 2017-04-ICD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Highly reliable Cu atom switch using thermally tolerant Polymer-solid Electrolyte (TT-PSE) for Nonvolatile Programmable Logic |
| Sub Title (in English) | |
| Keyword(1) | Atom switch |
| Keyword(2) | Crossbar |
| Keyword(3) | Nonvolatile programmable logic |
| Keyword(4) | |
| Keyword(5) | |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Koichiro Okamoto |
| 1st Author's Affiliation | NEC Corporation (NEC) |
| 2nd Author's Name | Munehiro Tada |
| 2nd Author's Affiliation | NEC Corporation (NEC) |
| 3rd Author's Name | Naoki Banno |
| 3rd Author's Affiliation | NEC Corporation (NEC) |
| 4th Author's Name | Noriyuki Iguchi |
| 4th Author's Affiliation | NEC Corporation (NEC) |
| 5th Author's Name | Hiromitsu Hada |
| 5th Author's Affiliation | NEC Corporation (NEC) |
| 6th Author's Name | Toshitsugu Sakamoto |
| 6th Author's Affiliation | NEC Corporation (NEC) |
| 7th Author's Name | Makoto Miyamura |
| 7th Author's Affiliation | NEC Corporation (NEC) |
| 8th Author's Name | Yukihide Tsuji |
| 8th Author's Affiliation | NEC Corporation (NEC) |
| 9th Author's Name | Ryusuke Nebashi |
| 9th Author's Affiliation | NEC Corporation (NEC) |
| 10th Author's Name | Ayuka Morioka |
| 10th Author's Affiliation | NEC Corporation (NEC) |
| 11th Author's Name | Xu Bai |
| 11th Author's Affiliation | NEC Corporation (NEC) |
| 12th Author's Name | Tadahiko Sugibayashi |
| 12th Author's Affiliation | NEC Corporation (NEC) |
| 13th Author's Name | |
| 13th Author's Affiliation | () |
| 14th Author's Name | |
| 14th Author's Affiliation | () |
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| 15th Author's Affiliation | () |
| 16th Author's Name | |
| 16th Author's Affiliation | () |
| 17th Author's Name | |
| 17th Author's Affiliation | () |
| 18th Author's Name | |
| 18th Author's Affiliation | () |
| Speaker | Author-1 |
| Date Time | 2017-04-21 11:00:00 |
| Presentation Time | 25 minutes |
| Registration for | ICD |
| Paper # | ICD2017-13 |
| Volume (vol) | vol.117 |
| Number (no) | no.9 |
| Page | pp.67-72 |
| #Pages | 6 |
| Date of Issue | 2017-04-13 (ICD) |
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