Paper Abstract and Keywords |
Presentation |
2017-04-21 11:00
[Invited Lecture]
Highly reliable Cu atom switch using thermally tolerant Polymer-solid Electrolyte (TT-PSE) for Nonvolatile Programmable Logic Koichiro Okamoto, Munehiro Tada, Naoki Banno, Noriyuki Iguchi, Hiromitsu Hada, Toshitsugu Sakamoto, Makoto Miyamura, Yukihide Tsuji, Ryusuke Nebashi, Ayuka Morioka, Xu Bai, Tadahiko Sugibayashi (NEC) ICD2017-13 Link to ES Tech. Rep. Archives: ICD2017-13 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Robust Cu atom switch with higher operation reliability has been developed featuring an over-400C thermally tolerant polymer-solid electrolyte (TT-PSE).The improved thermal tolerance of PSE enables atom switch integration using standard Cu-BEOL (fully 400oC) process. The TT-PSE also gives higher breakdown voltage (+1V) with keeping low set voltage (2V). Data retention characteristics after thermal cycle stress at temperature ranging from -65 to 150C for 1000 cycles are also confirmed for the first time. The developed atom switch is to be a technology enabler of reliable reprogrammable logics for future applications operated at high temperatures. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Atom switch / Crossbar / Nonvolatile programmable logic / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 117, no. 9, ICD2017-13, pp. 67-72, April 2017. |
Paper # |
ICD2017-13 |
Date of Issue |
2017-04-13 (ICD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
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ICD2017-13 Link to ES Tech. Rep. Archives: ICD2017-13 |
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