Paper Abstract and Keywords |
Presentation |
2017-06-05 13:55
Improved shunt-type AAN and its characteristics Takashi Shinozuka, Katsumi Fujii (NICT), Kazuhiro Takaya, Yoshiharu Akiyama (NTT), Akira Sugiura, Osami Wada (Kyoto Univ.) EMCJ2017-23 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
(Not available yet) |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
EMC test / EMI test / Asymmetric artificial network / AAN / ISN / / / |
Reference Info. |
IEICE Tech. Rep., vol. 117, no. 76, EMCJ2017-23, pp. 13-18, June 2017. |
Paper # |
EMCJ2017-23 |
Date of Issue |
2017-05-29 (EMCJ) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
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EMCJ2017-23 |