| Paper Abstract and Keywords |
| Presentation |
2017-06-20 15:15
Capacitance Analyses of p-ch GaN MOS Structure on Polarization ― Junction Substrate Rumi Takayama, Takuya Hoshii (Tokyo Inst. of Tech.), Akira Nakajima (AIST), Shinichi Nishizawa (Kyushu Univ.), Hiromichi Ohashi, Kuniyuki Kakushima, Hitoshi Wakabayashi, Kazuo Tsutsui (Tokyo Inst. of Tech.) SDM2017-27 |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
(Not available yet) |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
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| Reference Info. |
IEICE Tech. Rep., vol. 117, no. 101, SDM2017-27, pp. 31-34, June 2017. |
| Paper # |
SDM2017-27 |
| Date of Issue |
2017-06-13 (SDM) |
| ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
| Download PDF |
SDM2017-27 |
| Conference Information |
| Committee |
SDM |
| Conference Date |
2017-06-20 - 2017-06-20 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Campus Innovation Center Tokyo |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
Material Science and Process Technology for MOS Devices and Memories |
| Paper Information |
| Registration To |
SDM |
| Conference Code |
2017-06-SDM |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Capacitance Analyses of p-ch GaN MOS Structure on Polarization ― Junction Substrate |
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| 1st Author's Name |
Rumi Takayama |
| 1st Author's Affiliation |
Tokyo Institute of Technology (Tokyo Inst. of Tech.) |
| 2nd Author's Name |
Takuya Hoshii |
| 2nd Author's Affiliation |
Tokyo Institute of Technology (Tokyo Inst. of Tech.) |
| 3rd Author's Name |
Akira Nakajima |
| 3rd Author's Affiliation |
National Institute of Advanced Industrial Science and Technology (AIST) |
| 4th Author's Name |
Shinichi Nishizawa |
| 4th Author's Affiliation |
Kyushu University (Kyushu Univ.) |
| 5th Author's Name |
Hiromichi Ohashi |
| 5th Author's Affiliation |
Tokyo Institute of Technology (Tokyo Inst. of Tech.) |
| 6th Author's Name |
Kuniyuki Kakushima |
| 6th Author's Affiliation |
Tokyo Institute of Technology (Tokyo Inst. of Tech.) |
| 7th Author's Name |
Hitoshi Wakabayashi |
| 7th Author's Affiliation |
Tokyo Institute of Technology (Tokyo Inst. of Tech.) |
| 8th Author's Name |
Kazuo Tsutsui |
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Tokyo Institute of Technology (Tokyo Inst. of Tech.) |
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| Speaker |
Author-1 |
| Date Time |
2017-06-20 15:15:00 |
| Presentation Time |
20 minutes |
| Registration for |
SDM |
| Paper # |
SDM2017-27 |
| Volume (vol) |
vol.117 |
| Number (no) |
no.101 |
| Page |
pp.31-34 |
| #Pages |
4 |
| Date of Issue |
2017-06-13 (SDM) |