Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2017-11-10 13:00
[Poster Presentation] Correcting selection bias in active learning based on selective inference framework
Yu Inatsu (RIKEN), Ichiro Takeuchi (Nitech/RIKEN/NIMS) IBISML2017-74
Abstract (in Japanese) (See Japanese page) 
(in English) Consider the active learning that constructs regression model from given data and actually observes the value at the point where the predicted value is maximized.
In order to evaluate the goodness of this strategy, consider the hypothesis test that whether the expected value of the value at the candidate point is better than the current best.
However, if the above hypothesis is tested by classical testing methods, obtained results have a selection bias. As a result, the p value is erroneously evaluated.
In this paper, we use the concept of selective inference, and
evaluate the correct p value.
Keyword (in Japanese) (See Japanese page) 
(in English) Active Learning / Hypothesis Testing / Selective Inference / / / / /  
Reference Info. IEICE Tech. Rep., vol. 117, no. 293, IBISML2017-74, pp. 289-296, Nov. 2017.
Paper # IBISML2017-74 
Date of Issue 2017-11-02 (IBISML) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF IBISML2017-74

Conference Information
Committee IBISML  
Conference Date 2017-11-08 - 2017-11-10 
Place (in Japanese) (See Japanese page) 
Place (in English) Univ. of Tokyo 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Information-Based Induction Science Workshop (IBIS2017) 
Paper Information
Registration To IBISML 
Conference Code 2017-11-IBISML 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Correcting selection bias in active learning based on selective inference framework 
Sub Title (in English)  
Keyword(1) Active Learning  
Keyword(2) Hypothesis Testing  
Keyword(3) Selective Inference  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Yu Inatsu  
1st Author's Affiliation RIKEN (RIKEN)
2nd Author's Name Ichiro Takeuchi  
2nd Author's Affiliation Nagoya Institute of Technology/RIKEN/National Institute for Materials Science (Nitech/RIKEN/NIMS)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2017-11-10 13:00:00 
Presentation Time 150 minutes 
Registration for IBISML 
Paper # IBISML2017-74 
Volume (vol) vol.117 
Number (no) no.293 
Page pp.289-296 
#Pages 8 
Date of Issue 2017-11-02 (IBISML) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan