Paper Abstract and Keywords |
Presentation |
2017-11-22 14:15
Study on the Effect of Clock Rise Time on Fault Occurrence under IEMI Takuya Itoh (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2017-71 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
The intentional electromagnetic interference (IEMI) fault-injection method generates a fault by injecting a glitch into the clock rise. This means that there is a possibility of existence of a vulnerable clock rise time. A clock rise time has an effect on a frequency spectrum of a clock pulse. Therefore it is necessary to discuss the parameter in terms of a countermeasure against fault injection and electromagnetic compatibility. This paper discusses the parameter that is resistant to fault injection and effective for electromagnetic compatibility. We investigate the relation between a clock rise time and the number of fault occurrence by performing an IEMI fault injection experiment on actual cryptographic hardware while changing the clock rise time. The experimental result shows that shorter clock rise time leads to a reduction of the fault probability. This means that reducing the high-frequency emissions of the clock signal by reducing the clock rise time has a reverse effect on a countermeasure against fault injection. We also showed the parameter that is resistant to fault injection and effective for electromagnetic compatibility. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Intentional Electromagnetic Interference / Fault Timing / Fault Analysis / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 117, no. 319, EMCJ2017-71, pp. 41-44, Nov. 2017. |
Paper # |
EMCJ2017-71 |
Date of Issue |
2017-11-15 (EMCJ) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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EMCJ2017-71 |
Conference Information |
Committee |
EMCJ |
Conference Date |
2017-11-22 - 2017-11-22 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Young Scientist Meeting |
Paper Information |
Registration To |
EMCJ |
Conference Code |
2017-11-EMCJ |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Study on the Effect of Clock Rise Time on Fault Occurrence under IEMI |
Sub Title (in English) |
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Keyword(1) |
Intentional Electromagnetic Interference |
Keyword(2) |
Fault Timing |
Keyword(3) |
Fault Analysis |
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1st Author's Name |
Takuya Itoh |
1st Author's Affiliation |
Tohoku University (Tohoku Univ.) |
2nd Author's Name |
Yu-ichi Hayashi |
2nd Author's Affiliation |
Nara Institute of Science and Technology (NAIST) |
3rd Author's Name |
Takaaki Mizuki |
3rd Author's Affiliation |
Tohoku University (Tohoku Univ.) |
4th Author's Name |
Hideaki Sone |
4th Author's Affiliation |
Tohoku University (Tohoku Univ.) |
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Speaker |
Author-1 |
Date Time |
2017-11-22 14:15:00 |
Presentation Time |
25 minutes |
Registration for |
EMCJ |
Paper # |
EMCJ2017-71 |
Volume (vol) |
vol.117 |
Number (no) |
no.319 |
Page |
pp.41-44 |
#Pages |
4 |
Date of Issue |
2017-11-15 (EMCJ) |