IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2018-01-25 16:30
Revisit of limit in the IEEE standard for uniform magnetic field exposure using detailed human body model
Katsuaki Aga, Yudai Nakanishi, Akimasa Hirata (NITech) PN2017-66 EMT2017-103 OPE2017-144 LQE2017-126 EST2017-102 MWP2017-79 Link to ES Tech. Rep. Archives: EMT2017-103 OPE2017-144 LQE2017-126 EST2017-102 MWP2017-79
Abstract (in Japanese) (See Japanese page) 
(in English) In our daily life, we expose to electromagnetic fields generated from electrical equipment and electrical lines etc. There are two international guidelines /standards for human protection from electromagnetic fields, which is set forth in World Health Organization; ICNIRP and IEEE. In these guidelines, a limit of internal physical quantities is prescribed for practical compliance, corresponding to external electromagnetic field strength. For low frequency magnetic field exposure, the limit of the external electromagnetic field strength is based on the numerical calculation results using the detailed human body models in ICNIRP, while the IEEE refers to the value derived from an analytic solution for the homogeneous elliptic cross section. IEEE standard is currently under reivion, in which the introduction of detailed human body model is discussed. In this paper, we conducted computational dosimetry at frequencies up to 5 MHz, where the stimulation effect is dominant. Then, we re-examine the relationship between permissible magnetic field strength and in-situ electric field in anatomical human body models. We compare computational results with the basic restriction prescribed in the IEEE.
Keyword (in Japanese) (See Japanese page) 
(in English) Japanese adult model / In-situ electric field / SPFD method / Quasi-static approximation / / / /  
Reference Info. IEICE Tech. Rep., vol. 117, no. 408, EST2017-102, pp. 155-160, Jan. 2018.
Paper # EST2017-102 
Date of Issue 2018-01-18 (PN, EMT, OPE, LQE, EST, MWP) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF PN2017-66 EMT2017-103 OPE2017-144 LQE2017-126 EST2017-102 MWP2017-79 Link to ES Tech. Rep. Archives: EMT2017-103 OPE2017-144 LQE2017-126 EST2017-102 MWP2017-79

Conference Information
Committee EMT EST LQE MWP OPE PEM PN IEE-EMT 
Conference Date 2018-01-25 - 2018-01-26 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EST 
Conference Code 2018-01-EMT-EST-LQE-MWP-OPE-PEM-PN-EMT 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Revisit of limit in the IEEE standard for uniform magnetic field exposure using detailed human body model 
Sub Title (in English)  
Keyword(1) Japanese adult model  
Keyword(2) In-situ electric field  
Keyword(3) SPFD method  
Keyword(4) Quasi-static approximation  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Katsuaki Aga  
1st Author's Affiliation Nagoya Institute of Technology (NITech)
2nd Author's Name Yudai Nakanishi  
2nd Author's Affiliation Nagoya Institute of Technology (NITech)
3rd Author's Name Akimasa Hirata  
3rd Author's Affiliation Nagoya Institute of Technology (NITech)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2018-01-25 16:30:00 
Presentation Time 25 minutes 
Registration for EST 
Paper # PN2017-66, EMT2017-103, OPE2017-144, LQE2017-126, EST2017-102, MWP2017-79 
Volume (vol) vol.117 
Number (no) no.404(PN), no.405(EMT), no.406(OPE), no.407(LQE), no.408(EST), no.409(MWP) 
Page pp.155-160 
#Pages
Date of Issue 2018-01-18 (PN, EMT, OPE, LQE, EST, MWP) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan