IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2018-01-25 14:50
Deep Learning for End-to-End Automatic Target Recognition from Synthetic Aperture Radar Imagery
Hidetoshi Furukawa (Toshiba Infrastructure Systems & Solutions) SANE2017-92
Abstract (in Japanese) (See Japanese page) 
(in English) The standard architecture of synthetic aperture radar (SAR) automatic target recognition (ATR) consists of three stages: detection, discrimination, and classification. In recent years, convolutional neural networks (CNNs) for SAR ATR have been proposed, but most of them classify target classes from a target chip extracted from SAR imagery, as a classification for the third stage of SAR ATR. In this report, we propose a novel CNN for end-to-end ATR from SAR imagery. The CNN named verification support network (VersNet) performs all three stages of SAR ATR end-to-end. VersNet inputs a SAR image of arbitrary sizes with multiple classes and multiple targets, and outputs a SAR ATR image representing the position, class, and pose of each detected target. This report describes the evaluation results of VersNet which trained to output scores of all 12 classes: 10 target classes, a target front class, and a background class, for each pixel using the moving and stationary target acquisition and recognition (MSTAR) public dataset.
Keyword (in Japanese) (See Japanese page) 
(in English) automatic target recognition (ATR) / multiple targets / detection / classification / pose estimation / convolutional neural network (CNN) / deep learning / synthetic aperture radar (SAR)  
Reference Info. IEICE Tech. Rep., vol. 117, no. 403, SANE2017-92, pp. 35-40, Jan. 2018.
Paper # SANE2017-92 
Date of Issue 2018-01-18 (SANE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SANE2017-92

Conference Information
Committee SANE  
Conference Date 2018-01-25 - 2018-01-26 
Place (in Japanese) (See Japanese page) 
Place (in English) Nagasaki Prefectural Art Museum 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Positioning, navigation, Radar and general 
Paper Information
Registration To SANE 
Conference Code 2018-01-SANE 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Deep Learning for End-to-End Automatic Target Recognition from Synthetic Aperture Radar Imagery 
Sub Title (in English)  
Keyword(1) automatic target recognition (ATR)  
Keyword(2) multiple targets  
Keyword(3) detection  
Keyword(4) classification  
Keyword(5) pose estimation  
Keyword(6) convolutional neural network (CNN)  
Keyword(7) deep learning  
Keyword(8) synthetic aperture radar (SAR)  
1st Author's Name Hidetoshi Furukawa  
1st Author's Affiliation Toshiba Infrastructure Systems & Solutions Corporation (Toshiba Infrastructure Systems & Solutions)
2nd Author's Name  
2nd Author's Affiliation ()
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2018-01-25 14:50:00 
Presentation Time 25 minutes 
Registration for SANE 
Paper # SANE2017-92 
Volume (vol) vol.117 
Number (no) no.403 
Page pp.35-40 
#Pages
Date of Issue 2018-01-18 (SANE) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan