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Paper Abstract and Keywords
Presentation 2018-01-31 11:20
Fundamental investigation on characteristic change of YBCO thin films by focused ion beam processing
Yuji Miyato (Osaka Univ.) SCE2017-35
Abstract (in Japanese) (See Japanese page) 
(in English) Recently, the focused ion beam processing of YBCO thin films, leading to the local change of the superconducting characteristics, has attracted the researchers’ attention as a fabrication method of Josephson junctions. In this study, it was confirmed that the irradiation of helium or neon ion beams brought the change of YBCO film characteristics into insulating behavior or the decrease of the critical temperature, and that the critical temperature come back close to the initial value due to the recovery from the irradiation damage after annealing in an oxygen atmosphere. The experiment results were also analyzed by means of a Monte Carlo method, simulating how the incident ion could introduce the damage into the films.
Keyword (in Japanese) (See Japanese page) 
(in English) YBCO thin films / focused ion beam / Josephson junction / / / / /  
Reference Info. IEICE Tech. Rep., vol. 117, no. 428, SCE2017-35, pp. 21-26, Jan. 2018.
Paper # SCE2017-35 
Date of Issue 2018-01-24 (SCE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SCE2017-35

Conference Information
Committee SCE  
Conference Date 2018-01-31 - 2018-01-31 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) SQUID, high frequency, sensing technologies and their applications, etc. 
Paper Information
Registration To SCE 
Conference Code 2018-01-SCE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Fundamental investigation on characteristic change of YBCO thin films by focused ion beam processing 
Sub Title (in English)  
Keyword(1) YBCO thin films  
Keyword(2) focused ion beam  
Keyword(3) Josephson junction  
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1st Author's Name Yuji Miyato  
1st Author's Affiliation Osaka University (Osaka Univ.)
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Speaker Author-1 
Date Time 2018-01-31 11:20:00 
Presentation Time 25 minutes 
Registration for SCE 
Paper # SCE2017-35 
Volume (vol) vol.117 
Number (no) no.428 
Page pp.21-26 
#Pages 6 
Date of Issue 2018-01-24 (SCE) 

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