| Paper Abstract and Keywords |
| Presentation |
2018-02-28 15:50
Construction of simulation for analyzing thermal conduction in nanostructures Naomi Yamashita, Yuya Ota, Ryo Nanao, Hiroshi Inokawa, Masaru Shimomura, Kenji Murakami, Hiroya Ikeda (Shizuoka Univ.) ED2017-112 SDM2017-112 |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
With the aim of characterizing the thermal conductivity for nanometer-scale thermoelectric materials, we have constructed a new measurement system based on ac calorimetry. Analysis of the obtained data requires time-evolution of temperature distribution in nanometer-scale material under periodic heating. In this study, we made a simulation using a C#-program for time-dependent temperature distribution, based on 2-dimensional heat-diffusion equation including the influence of heat emission from material edges. The simulation was applied to AlN with millimeter-scale dimensions for confirming the validity and accuracy. The simulated thermal diffusivity for 10$times$75-mm$^{2}$-area AlN was 1.3x10^-4 m^2/s, which was larger than the value set in the heat-diffusion equation. This overestimation was also observed in the experiment. Therefore, our simulation can reproduce the unsteady heat conduction and be used for analyzing the ac calorimetry experiment. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
thermal diffusivity / ac calorimetry / heat diffusion equation / AlN / / / / |
| Reference Info. |
IEICE Tech. Rep., vol. 117, no. 454, SDM2017-112, pp. 35-38, Feb. 2018. |
| Paper # |
SDM2017-112 |
| Date of Issue |
2018-02-21 (ED, SDM) |
| ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
| Download PDF |
ED2017-112 SDM2017-112 |
| Conference Information |
| Committee |
ED SDM |
| Conference Date |
2018-02-28 - 2018-02-28 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Centennial Hall, Hokkaido Univ. |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
Functional nanodevices and related technologies |
| Paper Information |
| Registration To |
SDM |
| Conference Code |
2018-02-ED-SDM |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Construction of simulation for analyzing thermal conduction in nanostructures |
| Sub Title (in English) |
|
| Keyword(1) |
thermal diffusivity |
| Keyword(2) |
ac calorimetry |
| Keyword(3) |
heat diffusion equation |
| Keyword(4) |
AlN |
| Keyword(5) |
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| Keyword(6) |
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| Keyword(7) |
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| 1st Author's Name |
Naomi Yamashita |
| 1st Author's Affiliation |
Shizuoka University (Shizuoka Univ.) |
| 2nd Author's Name |
Yuya Ota |
| 2nd Author's Affiliation |
Shizuoka University (Shizuoka Univ.) |
| 3rd Author's Name |
Ryo Nanao |
| 3rd Author's Affiliation |
Shizuoka University (Shizuoka Univ.) |
| 4th Author's Name |
Hiroshi Inokawa |
| 4th Author's Affiliation |
Shizuoka University (Shizuoka Univ.) |
| 5th Author's Name |
Masaru Shimomura |
| 5th Author's Affiliation |
Shizuoka University (Shizuoka Univ.) |
| 6th Author's Name |
Kenji Murakami |
| 6th Author's Affiliation |
Shizuoka University (Shizuoka Univ.) |
| 7th Author's Name |
Hiroya Ikeda |
| 7th Author's Affiliation |
Shizuoka University (Shizuoka Univ.) |
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| Speaker |
Author-7 |
| Date Time |
2018-02-28 15:50:00 |
| Presentation Time |
25 minutes |
| Registration for |
SDM |
| Paper # |
ED2017-112, SDM2017-112 |
| Volume (vol) |
vol.117 |
| Number (no) |
no.453(ED), no.454(SDM) |
| Page |
pp.35-38 |
| #Pages |
4 |
| Date of Issue |
2018-02-21 (ED, SDM) |