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Paper Abstract and Keywords
Presentation 2018-02-28 14:40
Construction of Seebeck coefficient evaluation technique by Kelvin-probe force microscopy
Yuhei Suzuki, Akito Oka, Taketo Kawai, Hirokazu Tatsuoka, Hiroshi Inokawa, Masaru Shimomura, Kenji Murakami (Shizuoka Univ.), Faiz Salleh (Univ. of Malaya), Hiroya Ikeda (Shizuoka Univ.) ED2017-110 SDM2017-110
Abstract (in Japanese) (See Japanese page) 
(in English) Although the introduction of nanostructures into thermoelectric materials is one of key technology for enhancement in thermoelectric conversion efficiency, a technique for characterizing the nanometer-scale material is required. With the aim of evaluating Seebeck coefficient of nanostructured thermoelectric materials, we propose a new technique by Kelvin-probe force microscopy (KFM) which gives us local surface potential corresponding to the Fermi energy difference of a sample relative to the cantilever. Hence, thermoelectromotive force and temperature difference are obtained from the surface potentials and temperatures at the high- and low-temperature regions on the sample, which leads to evaluation of Seebeck coefficient. In this study, the Seebeck coefficient of Si-on-insulator (SOI) layer is evaluated by KFM. In addition, the measurement technique of local temperature by KFM is also described.
Keyword (in Japanese) (See Japanese page) 
(in English) thermoelectrics / nanostructure / Seebeck coefficient / Kelvin-probe force microscopy (KFM) / / / /  
Reference Info. IEICE Tech. Rep., vol. 117, no. 454, SDM2017-110, pp. 27-30, Feb. 2018.
Paper # SDM2017-110 
Date of Issue 2018-02-21 (ED, SDM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ED2017-110 SDM2017-110

Conference Information
Committee ED SDM  
Conference Date 2018-02-28 - 2018-02-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Centennial Hall, Hokkaido Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Functional nanodevices and related technologies 
Paper Information
Registration To SDM 
Conference Code 2018-02-ED-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Construction of Seebeck coefficient evaluation technique by Kelvin-probe force microscopy 
Sub Title (in English)  
Keyword(1) thermoelectrics  
Keyword(2) nanostructure  
Keyword(3) Seebeck coefficient  
Keyword(4) Kelvin-probe force microscopy (KFM)  
Keyword(5)  
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1st Author's Name Yuhei Suzuki  
1st Author's Affiliation Shizuoka University (Shizuoka Univ.)
2nd Author's Name Akito Oka  
2nd Author's Affiliation Shizuoka University (Shizuoka Univ.)
3rd Author's Name Taketo Kawai  
3rd Author's Affiliation Shizuoka University (Shizuoka Univ.)
4th Author's Name Hirokazu Tatsuoka  
4th Author's Affiliation Shizuoka University (Shizuoka Univ.)
5th Author's Name Hiroshi Inokawa  
5th Author's Affiliation Shizuoka University (Shizuoka Univ.)
6th Author's Name Masaru Shimomura  
6th Author's Affiliation Shizuoka University (Shizuoka Univ.)
7th Author's Name Kenji Murakami  
7th Author's Affiliation Shizuoka University (Shizuoka Univ.)
8th Author's Name Faiz Salleh  
8th Author's Affiliation University of Malaya (Univ. of Malaya)
9th Author's Name Hiroya Ikeda  
9th Author's Affiliation Shizuoka University (Shizuoka Univ.)
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Speaker Author-9 
Date Time 2018-02-28 14:40:00 
Presentation Time 25 minutes 
Registration for SDM 
Paper # ED2017-110, SDM2017-110 
Volume (vol) vol.117 
Number (no) no.453(ED), no.454(SDM) 
Page pp.27-30 
#Pages 4 
Date of Issue 2018-02-21 (ED, SDM) 

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