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Paper Abstract and Keywords
Presentation 2018-02-28 10:25
Numerical Simulation on Single-Electron Effects in Random Arrays of Small Tunnel Junctions
Yoshinao Mizugaki, Masataka Moriya, Hiroshi Shimada, Kazuhiko Matsumoto, Makoto Moribayashi, Tomoki Yagai (UEC Tokyo), Yasuo Kimura (Tokyo Univ. Tech.), Ayumi Hirano-Iwata (Tohoku Univ.), Fumihiko Hirose (Yamagata Univ.) ED2017-105 SDM2017-105 Link to ES Tech. Rep. Archives: ED2017-105 SDM2017-105
Abstract (in Japanese) (See Japanese page) 
(in English) We have worked on single-electron devices comprising random arrays of gold nanoparticles, which are fabricated using dispersion of colloidal gold solution over electrodes. In this method, no precise positioning of gold nanoparticles is employed. There are several parameters such as sizes and densities of gold nanoparticles, layouts of electrodes, etc., that should be considered in experiment. Numerical simulation is expected to provide useful guidelines for experimental conditions. In this work, we numerically simulate electrical characteristics of conductive particles randomly placed on triangle grids. Besides demonstration of random paths between two electrodes through particles, electric resistances and Coulomb blockade voltages are simulated as functions of occupation probabilities of conductive particles on grids.
Keyword (in Japanese) (See Japanese page) 
(in English) Single-Electron Effects / Gold Nanoparticles / Percolation / Monte-Carlo Simulation / / / /  
Reference Info. IEICE Tech. Rep., vol. 117, no. 453, ED2017-105, pp. 7-10, Feb. 2018.
Paper # ED2017-105 
Date of Issue 2018-02-21 (ED, SDM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ED2017-105 SDM2017-105 Link to ES Tech. Rep. Archives: ED2017-105 SDM2017-105

Conference Information
Committee ED SDM  
Conference Date 2018-02-28 - 2018-02-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Centennial Hall, Hokkaido Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Functional nanodevices and related technologies 
Paper Information
Registration To ED 
Conference Code 2018-02-ED-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Numerical Simulation on Single-Electron Effects in Random Arrays of Small Tunnel Junctions 
Sub Title (in English)  
Keyword(1) Single-Electron Effects  
Keyword(2) Gold Nanoparticles  
Keyword(3) Percolation  
Keyword(4) Monte-Carlo Simulation  
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1st Author's Name Yoshinao Mizugaki  
1st Author's Affiliation The University of Electro-Communications (UEC Tokyo)
2nd Author's Name Masataka Moriya  
2nd Author's Affiliation The University of Electro-Communications (UEC Tokyo)
3rd Author's Name Hiroshi Shimada  
3rd Author's Affiliation The University of Electro-Communications (UEC Tokyo)
4th Author's Name Kazuhiko Matsumoto  
4th Author's Affiliation The University of Electro-Communications (UEC Tokyo)
5th Author's Name Makoto Moribayashi  
5th Author's Affiliation The University of Electro-Communications (UEC Tokyo)
6th Author's Name Tomoki Yagai  
6th Author's Affiliation The University of Electro-Communications (UEC Tokyo)
7th Author's Name Yasuo Kimura  
7th Author's Affiliation Tokyo University of Technology (Tokyo Univ. Tech.)
8th Author's Name Ayumi Hirano-Iwata  
8th Author's Affiliation Tohoku University (Tohoku Univ.)
9th Author's Name Fumihiko Hirose  
9th Author's Affiliation Yamagata University (Yamagata Univ.)
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Speaker Author-1 
Date Time 2018-02-28 10:25:00 
Presentation Time 25 minutes 
Registration for ED 
Paper # ED2017-105, SDM2017-105 
Volume (vol) vol.117 
Number (no) no.453(ED), no.454(SDM) 
Page pp.7-10 
#Pages
Date of Issue 2018-02-21 (ED, SDM) 


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