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Paper Abstract and Keywords
Presentation 2018-03-01 09:20
A study of high reliability on controlling multiple physical nodes as a single logical node
Takayoshi Hirasawa, Hitoshi Irino, Hirotaka Yoshioka (NTT) NS2017-172
Abstract (in Japanese) (See Japanese page) 
(in English) This paper proposes a new network architecture, where merchant-silicon-based datacenter switches are centrally controlled with high reliability. For compatibility with an existing network, in the new architecture, multiple switches are controlled as a single logical node against the other network element while avoiding single point of failure.
We experimentally implemented a method from several candidate designs and demonstrated controlling multiple switches as a single logical node in proposed architecture. Also, we quantitatively showed the effectiveness of the proposed architecture by load measurement.
Keyword (in Japanese) (See Japanese page) 
(in English) SDN / OpenFlow / White-box switch / Logical node / / / /  
Reference Info. IEICE Tech. Rep., vol. 117, no. 459, NS2017-172, pp. 27-32, March 2018.
Paper # NS2017-172 
Date of Issue 2018-02-22 (NS) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF NS2017-172

Conference Information
Committee NS IN  
Conference Date 2018-03-01 - 2018-03-02 
Place (in Japanese) (See Japanese page) 
Place (in English) Phoenix Seagaia Resort 
Topics (in Japanese) (See Japanese page) 
Topics (in English) General 
Paper Information
Registration To NS 
Conference Code 2018-03-NS-IN 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A study of high reliability on controlling multiple physical nodes as a single logical node 
Sub Title (in English)  
Keyword(1) SDN  
Keyword(2) OpenFlow  
Keyword(3) White-box switch  
Keyword(4) Logical node  
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1st Author's Name Takayoshi Hirasawa  
1st Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
2nd Author's Name Hitoshi Irino  
2nd Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
3rd Author's Name Hirotaka Yoshioka  
3rd Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
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Speaker Author-1 
Date Time 2018-03-01 09:20:00 
Presentation Time 20 minutes 
Registration for NS 
Paper # NS2017-172 
Volume (vol) vol.117 
Number (no) no.459 
Page pp.27-32 
#Pages 6 
Date of Issue 2018-02-22 (NS) 

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