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Paper Abstract and Keywords
Presentation 2018-03-02 11:00
Study on frequency dependence measurements of the interface relative conductivity using a dielectric rod resonator sandwiched between copper-clad dielectric substrates
Yusaku Hirano, Takashi Shimizu, Yoshinori Kogami (Utsunomiya Univ.) MW2017-191 ICD2017-115
Abstract (in Japanese) (See Japanese page) 
(in English) We studied on evaluation techniques of the interface relative conductivity using a dielectric rod resonator sandwiched between copper-clad dielectric substrates. In this paper, we evaluated the frequency dependence of the interface relative conductivity of the copper-clad dielectric substrates in the frequency range of 3-30GHz using dielectric rods of (ZrSn)TiO4, Ba(MgTa)O3 and sapphire. As a result, we revealed that consideration of frequency dependence of loss tangent is important to calculate the measured value of the interface relative conductivity, and measurement accuracy is improved by using the corrected value of loss tangent in the measurement frequency of the interface relative conductivity.
Keyword (in Japanese) (See Japanese page) 
(in English) Copper-clad dielectric substrate / Dielectric rod resonator / Interface relative conductivity / Microwave / / / /  
Reference Info. IEICE Tech. Rep., vol. 117, no. 462, MW2017-191, pp. 83-86, March 2018.
Paper # MW2017-191 
Date of Issue 2018-02-22 (MW, ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF MW2017-191 ICD2017-115

Conference Information
Committee ICD MW  
Conference Date 2018-03-01 - 2018-03-02 
Place (in Japanese) (See Japanese page) 
Place (in English) The University of Shiga Prefecture 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Microwave Integrated Circuit/Microwave Technologies 
Paper Information
Registration To MW 
Conference Code 2018-03-ICD-MW 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Study on frequency dependence measurements of the interface relative conductivity using a dielectric rod resonator sandwiched between copper-clad dielectric substrates 
Sub Title (in English)  
Keyword(1) Copper-clad dielectric substrate  
Keyword(2) Dielectric rod resonator  
Keyword(3) Interface relative conductivity  
Keyword(4) Microwave  
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1st Author's Name Yusaku Hirano  
1st Author's Affiliation Utsunomiya University (Utsunomiya Univ.)
2nd Author's Name Takashi Shimizu  
2nd Author's Affiliation Utsunomiya University (Utsunomiya Univ.)
3rd Author's Name Yoshinori Kogami  
3rd Author's Affiliation Utsunomiya University (Utsunomiya Univ.)
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Speaker Author-1 
Date Time 2018-03-02 11:00:00 
Presentation Time 25 minutes 
Registration for MW 
Paper # MW2017-191, ICD2017-115 
Volume (vol) vol.117 
Number (no) no.462(MW), no.463(ICD) 
Page pp.83-86 
#Pages 4 
Date of Issue 2018-02-22 (MW, ICD) 

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